Datasheet

Appendix A Electrical Characteristics
MC9S08QG8 and MC9S08QG4 Data Sheet, Rev. 5
284 Freescale Semiconductor
Conversion time
(including sample
time)
Short sample (ADLSMP=0) t
ADC
—20—ADCK
cycles
See
Tabl e 9 -12 for
conversion
time variances
Long sample (ADLSMP=1) — 40 —
Sample time Short sample (ADLSMP=0) t
ADS
—3.5—ADCK
cycles
Long sample (ADLSMP=1) — 23.5 —
Total unadjusted error 10 bit mode E
TUE
— ±1.5 ±3.5 LSB
2
Includes
quantization
8 bit mode — ±0.7 ±1.5
Differential
non-linearity
10 bit mode DNL — ±0.5 ±1.0 LSB
2
Monotonicity
and no
missing codes
guaranteed
8 bit mode — ±0.3 ±0.5
Integral non-linearity 10 bit mode INL — ±0.5 ±1.0 LSB
2
8 bit mode — ±0.3 ±0.5
Zero-scale error 10 bit mode E
ZS
— ±1.5 ±2.1 LSB
2
V
ADIN
= V
SS
8 bit mode — ±0.5 ±0.7
Full-scale error 10 bit mode E
FS
0 ±1.0 ±1.5 LSB
2
V
ADIN
= V
DD
8 bit mode 0 ±0.5 ±0.5
Quantization error 10 bit mode E
Q
——±0.5 LSB
2
8 bit mode — — ±0.5
Input leakage error 10 bit mode E
IL
0 ±0.2 ±4LSB
2
Pad leakage
3
*
R
AS
8 bit mode 0 ±0.1 ±1.2
Temp sensor
slope
-40°C– 25°Cm—1.646—mV/°C
25°C– 85°C—1.769—
Temp sensor
voltage
25°CV
TEMP25
— 701.2 — mV
1
Typical values assume V
DD
= 3.0 V, Temp = 25°C, f
ADCK
= 1.0 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2
1 LSB = (V
REFH
- V
REFL
)/2
N
3
Based on input pad leakage current. Refer to pad electricals.
Table A-14. 3 Volt 10-bit ADC Characteristics (continued)
Characteristic Conditions Symb Min Typ
1
Max Unit Comment