Datasheet

Appendix A Electrical Characteristics
MC9S08EL32 Series and MC9S08SL16 Series Data Sheet, Rev. 3
354 Freescale Semiconductor
A.14.2 Conducted Transient Susceptibility
Microcontroller transient conducted susceptibility is measured in accordance with an internal Freescale
test method. The measurement is performed with the microcontroller installed on a custom EMC
evaluation board and running specialized EMC test software designed in compliance with the test method.
The conducted susceptibility is determined by injecting the transient susceptibility signal on each pin of
the microcontroller. The transient waveform and injection methodology is based on IEC 61000-4-4
(EFT/B). The transient voltage required to cause performance degradation on any pin in the tested
configuration is greater than or equal to the reported levels unless otherwise indicated by footnotes below
Table A-18.
The susceptibility performance classification is described in Table A-19.
1
Data based on qualification test results.
Table A-18. Conducted Susceptibility, EFT/B
Parameter Symbol Conditions
f
OSC
/f
BUS
Result
Amplitude
1
(Min)
1
Data based on qualification test results. Not tested in production.
Unit
Conducted susceptibility, electrical
fast transient/burst (EFT/B)
V
CS_EFT
V
DD
= 5.0V
T
A
= +25
o
C
28 TSSOP
package type
4MHz crystal
20MHz bus
AN/A
V
B ±300 – ±3700
CN/A
DN/A
E −3800
Table A-19. Susceptibility Performance Classification
Result Performance Criteria
A No failure The MCU performs as designed during and after exposure.
B Self-recovering
failure
The MCU does not perform as designed during exposure. The MCU returns
automatically to normal operation after exposure is removed.
C Soft failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the RESET pin is asserted.
D Hard failure The MCU does not perform as designed during exposure. The MCU does not return to
normal operation until exposure is removed and the power to the MCU is cycled.
E Damage The MCU does not perform as designed during and after exposure. The MCU cannot
be returned to proper operation due to physical damage or other permanent
performance degradation.