Datasheet

MC9S12DT128B Device User Guide — V01.09
A.2.3 ATD accuracy
Table A-10 specifies the ATD conversion performance excluding any errors due to current injection,
input capacitance and source resistance.
Table A-10 ATD Conversion Performance
For the following definitions see also Figure A-1.
Differential Non-Linearity (DNL) is defined as the difference between two adjacent switching steps.
The Integral Non-Linearity (INL) is defined as the sum of all DNLs:
Conditions are shown in Table A-4 unless otherwise noted
V
REF
= V
RH
- V
RL
= 5.12V. Resulting to one 8 bit count = 20mV and one 10 bit count = 5mV
f
ATDCLK
= 2.0MHz
Num C Rating Symbol Min Typ Max Unit
1 P 10-Bit Resolution LSB 5 mV
2 P 10-Bit Differential Nonlinearity DNL –1 1 Counts
3 P 10-Bit Integral Nonlinearity INL –2.5 ±1.5 2.5 Counts
4P
10-Bit Absolute Error
1
NOTES:
1. These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE -3 ±2.0 3 Counts
5 P 8-Bit Resolution LSB 20 mV
6 P 8-Bit Differential Nonlinearity DNL –0.5 0.5 Counts
7 P 8-Bit Integral Nonlinearity INL –1.0 ±0.5 1.0 Counts
8P
8-Bit Absolute Error
(1)
AE -1.5 ±1.0 1.5 Counts
DNL i()
V
i
V
i1–
–
1LSB
------------------------
1–=
INL n() DNL i()
i1=
n
∑
V
n
V
0
–
1LSB
--------------------
n–==
Freescale Semiconductor, I
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
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