Datasheet

Chapter 2 256 Kbyte Flash Module (S12FTS256K2V1)
MC9S12E256 Data Sheet, Rev. 1.10
Freescale Semiconductor 91
The security function in the Flash module is described in Section 2.6, “Flash Module Security”.
2.3.2.3 Flash Test Mode Register (FTSTMOD)
The unbanked FTSTMOD register is used to control Flash test features.
All bits read 0 and are not writable in normal mode. The WRALL bit is writable only in special mode to
simplify mass erase and erase verify operations. When writing to the FTSTMOD register in special mode,
all unimplemented/reserved bits must be written to 0.
2.3.2.4 Flash Configuration Register (FCNFG)
The unbanked FCNFG register enables the Flash interrupts and gates the security backdoor writes.
CBEIE, CCIE, KEYACC and BKSEL bits are readable and writable while all remaining bits read 0 and
are not writable. KEYACC is only writable if KEYEN (see Section 2.3.2.2) is set to the enabled state.
Module Base + 0x0002
76543210
R000
WRALL
0000
W
Reset 00000000
= Unimplemented or Reserved
Figure 2-6. Flash Test Mode Register (FTSTMOD)
Table 2-9. FTSTMOD Field Descriptions
Field Description
4
WRALL
Write to All Register Banks — If the WRALL bit is set, all banked registers sharing the same register address
will be written simultaneously during a register write.
0 Write only to the bank selected via BKSEL.
1 Write to all register banks.
Module Base + 0x0003
76543210
R
CBEIE CCIE KEYACC
0000
BKSEL
W
Reset 00000000
= Unimplemented or Reserved
Figure 2-7. Flash Configuration Register (FCNFG)