Datasheet

Electrical Characteristics

MCF51AC256 ColdFire Microcontroller Data Sheet, Rev.7

Freescale Semiconductor 17

2 Electrical Characteristics

This section contains electrical specification tables and reference timing diagrams for the MCF51AC256

microcontroller, including detailed information on power considerations, DC/AC electrical characteristics,

and AC timing specifications.

The electrical specifications are preliminary and are from previous designs or design simulations. These

specifications may not be fully tested or guaranteed at this early stage of the product life cycle. These

specifications will, however, be met for production silicon. Finalized specifications will be published after

complete characterization and device qualifications have been completed.

NOTE

The parameters specified in this data sheet supersede any values found in

the module specifications.

2.1 Parameter Classification

The electrical parameters shown in this supplement are guaranteed by various methods. To give the

customer a better understanding the following classification is used and the parameters are tagged

accordingly in the tables where appropriate:

NOTE

The classification is shown in the column labeled “C” in the parameter

tables where appropriate.

2.2 Absolute Maximum Ratings

Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not

guaranteed. Stress beyond the limits specified in Table 6 may affect device reliability or cause permanent

damage to the device. For functional operating conditions, refer to the remaining tables in this section.

This device contains circuitry protecting against damage due to high static voltage or electrical fields;

however, it is advised that normal precautions be taken to avoid application of any voltages higher than

maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused

inputs are tied to an appropriate logic voltage level (for instance, either V

or V

Table 5. Parameter Classifications

Those parameters are guaranteed during production testing on each individual device.

Those parameters are achieved by the design characterization by measuring a statistically relevant

sample size across process variations.

Those parameters are achieved by design characterization on a small sample size from typical devices

under typical conditions unless otherwise noted. All values shown in the typical column are within this

category.

Those parameters are derived mainly from simulations.