Datasheet

xl MCF5407 User’s Manual
Acronyms and Abbreviations
BDM Background debug mode
BIST Built-in self test
BSDL Boundary-scan description language
CODEC Code/decode
DAC Digital-to-analog conversion
DMA Direct memory access
DSP Digital signal processing
EA Effective address
EDO Extended data output (DRAM)
FIFO First-in, first-out
GPIO General-purpose I/O
I
2
C Inter-integrated circuit
IEEE Institute for Electrical and Electronics Engineers
IFP Instruction fetch pipeline
IPL Interrupt priority level
JEDEC Joint Electron Device Engineering Council
JTAG Joint Test Action Group
LIFO Last-in, first-out
LRU Least recently used
LSB Least-significant byte
lsb Least-significant bit
MAC Multiple accumulate unit
MBAR Memory base address register
MSB Most-significant byte
msb Most-significant bit
Mux Multiplex
NOP No operation
OEP Operand execution pipeline
PC Program counter
PCLK Processor clock
PLL Phase-locked loop
PLRU Pseudo least recently used
Table i. Acronyms and Abbreviated Terms (Continued)
Term Meaning