Datasheet
Table Of Contents
- MCF5441x ColdFire Microprocessor Data Sheet
- 1 MCF5441x family comparison
- 2 Hardware design considerations
- 3 Pin assignments and reset states
- 4 Electrical characteristics
- 4.1 Absolute maximum ratings
- 4.2 Thermal characteristics
- 4.3 ESD protection
- 4.4 Static latch-up (LU)
- 4.5 DC electrical specifications
- 4.6 Output pad loading and slew rate
- 4.7 DDR pad drive strengths
- 4.8 Oscillator and PLL electrical characteristics
- 4.9 Reset timing specifications
- 4.10 FlexBus timing specifications
- 4.11 NAND flash controller (NFC) timing specifications
- 4.12 DDR SDRAM controller timing specifications
- 4.13 USB transceiver timing specifications
- 4.14 ULPI timing specifications
- 4.15 eSDHC timing specifications
- 4.16 SIM timing specifications
- 4.17 SSI timing specifications
- 4.18 12-bit ADC specifications
- 4.19 12-bit DAC timing specifications
- 4.20 mcPWM timing specifications
- 4.21 I2C timing specifications
- 4.22 Ethernet assembly timing specifications
- 4.23 32-bit timer module timing specifications
- 4.24 DSPI timing specifications
- 4.25 SBF timing specifications
- 4.26 1-Wire timing specifications
- 4.27 General purpose I/O timing specifications
- 4.28 Rapid general purpose I/O timing specifications
- 4.29 JTAG and boundary scan timing specifications
- 4.30 Debug AC timing specifications
- 5 Package information
- 6 Product documentation
- 7 Revision history
MCF5441x ColdFire Microprocessor Data Sheet, Rev. 8
Electrical characteristics
Freescale Semiconductor34
Figure 16. Read data latch timing
4.12 DDR SDRAM controller timing specifications
The following timing numbers must be followed to properly latch or drive data onto the SDRAM memory bus. All timing
numbers are relative to the DQS byte lanes.
Table 18. SDRAM timing specifications
Num Characteristic Symbol Min Max Unit Notes
Frequency of operation 100 250 MHz
DD1 Clock period t
SDCK
4.0 10.0 ns
DD2 Pulse width high t
SDCKH
0.45 0.55 t
SDCK
1
1
Pulse width high plus pulse width low cannot exceed min and max clock period.
DD3 Pulse width low t
SDCKL
0.45 0.55 t
SDCK
3
DD4 Address, SD_CKE, SD_CAS
, SD_RAS,
SD_WE, SD_CS[1:0] — output valid
t
CMV
—0.5 t
SDCK
+ 1 ns
2
2
Command output valid should be 1/2 the memory bus clock (t
SDCK
) plus some minor adjustments for process, temperature,
and voltage variations.
DD5 Address, SD_CKE, SD_CAS, SD_RAS,
SD_WE, SD_CS[1:0] — output hold
t
CMH
0.5 t
SDCK
– 1 — ns
DD6 Write command to first DQS latching transition t
DQSS
—WL+0.2 t
SDCK
ns
DD7 Data and data mask output setup (DQDQS)
relative to DQS (DDR write mode)
t
QS
0.4 — ns
3
4
DD8 Data and data mask output hold (DQSDQ)
relative to DQS (DDR write mode)
t
QH
0.4 — ns
5
DD9 Input data skew relative to DQS (input setup) t
IS
—0.5ns
6
DD10 Input data hold relative to DQS. t
IH
0.375 t
SDCK
—ns
7
NFC_R/B
NF13
NFC_CE
NFC_RE
NFC_IO[15:0]
Data from NF
NF5
NF15
NF16
NF10
NF14
NF17
