Freescale Semiconductor, Inc. Data Sheet: Technical Data KL25P80M48SF0 Rev 4 03/2014 Kinetis KL25 Sub-Family MKL25ZxxVFM4 MKL25ZxxVFT4 MKL25ZxxVLH4 MKL25ZxxVLK4 48 MHz Cortex-M0+ Based Microcontroller with USB Designed with efficiency in mind. Compatible with all other Kinetis L families as well as Kinetis K2x family. General purpose MCU with USB 2.0, featuring market leading ultra low-power to provide developers an appropriate entry-level 32-bit solution.
• Flash write voltage range: 1.71 to 3.
Table of Contents 1 Ratings..................................................................................4 1.1 Thermal handling ratings...............................................4 1.2 Moisture handling ratings...............................................4 1.3 ESD handling ratings.....................................................4 1.4 Voltage and current operating ratings............................4 2 General.................................................................................5 2.
Ratings 1 Ratings 1.1 Thermal handling ratings Table 1. Thermal handling ratings Symbol Description Min. Max. Unit Notes TSTG Storage temperature –55 150 °C 1 TSDR Solder temperature, lead-free — 260 °C 2 1. Determined according to JEDEC Standard JESD22-A103, High Temperature Storage Life. 2. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices. 1.2 Moisture handling ratings Table 2.
General 1.4 Voltage and current operating ratings Table 4. Voltage and current operating ratings Symbol Description Min. Max. Unit VDD Digital supply voltage –0.3 3.8 V IDD Digital supply current — 120 mA VIO IO pin input voltage –0.3 VDD + 0.3 V Instantaneous maximum current single pin limit (applies to all port pins) –25 25 mA ID VDDA Analog supply voltage VDD – 0.3 VDD + 0.3 V VUSB_DP USB_DP input voltage –0.3 3.63 V VUSB_DM USB_DM input voltage –0.3 3.
General 2.2 Nonswitching electrical specifications 2.2.1 Voltage and current operating requirements Table 5. Voltage and current operating requirements Symbol Description Min. Max. Unit VDD Supply voltage 1.71 3.6 V VDDA Analog supply voltage 1.71 3.6 V — VDD – VDDA VDD-to-VDDA differential voltage –0.1 0.1 V — VSS – VSSA VSS-to-VSSA differential voltage –0.1 0.1 V — VIH VIL Input high voltage — • 2.7 V ≤ VDD ≤ 3.6 V 0.7 × VDD — V • 1.7 V ≤ VDD ≤ 2.7 V 0.
General Table 6. VDD supply LVD and POR operating requirements (continued) Symbol Description Min. Typ. Max. Unit Notes Low-voltage warning thresholds — high range 1 VLVW1H • Level 1 falling (LVWV = 00) 2.62 2.70 2.78 V VLVW2H • Level 2 falling (LVWV = 01) 2.72 2.80 2.88 V VLVW3H • Level 3 falling (LVWV = 10) 2.82 2.90 2.98 V VLVW4H • Level 4 falling (LVWV = 11) 2.92 3.00 3.08 V — ±60 — mV — 1.54 1.60 1.
General Table 7. Voltage and current operating behaviors (continued) Symbol Description • 2.7 V ≤ VDD ≤ 3.6 V, IOL = 5 mA Min. Max. Unit — 0.5 V Notes • 1.71 V ≤ VDD ≤ 2.7 V, IOL = 1.5 mA VOL Output low voltage — High drive pad 1 • 2.7 V ≤ VDD ≤ 3.6 V, IOL = 18 mA — 0.5 V • 1.71 V ≤ VDD ≤ 2.7 V, IOL = 6 mA — 0.
General Table 8. Power mode transition operating behaviors (continued) Symbol Description Min. Typ. Max. Unit — 95 115 μs — 93 115 μs — 42 53 μs — 4 4.6 μs — 4 4.4 μs — 4 4.4 μs instruction across the operating temperature range of the chip. • VLLS0 → RUN • VLLS1 → RUN • VLLS3 → RUN • LLS → RUN • VLPS → RUN • STOP → RUN 1. Normal boot (FTFA_FOPT[LPBOOT]=11). 2.2.5 Power consumption operating behaviors Table 9.
General Table 9. Power consumption operating behaviors (continued) Symbol Description • at 3.0 V Min. Typ. Max. Unit — 6.8 8.3 mA — 3.7 5.0 mA — 2.9 4.2 mA — 2.5 3.7 mA — 188 570 μA — 224 613 μA — 300 745 μA — 135 496 μA — 345 490 μA — 357 827 — 392 869 — 438 927 — 551 1065 — 4.
General Table 9. Power consumption operating behaviors (continued) Symbol Min. Typ. Max. Unit at 25 °C Description — 10 35 μA at 50 °C — 20 50 at 70 °C — 37 112 at 85 °C — 81 201 1.9 3.7 3.6 39 6.5 43 13 49 30 69 — 1.4 3.2 — 2.5 19 — 5.1 21 — 9.2 26 — 21 38 — 0.7 — 1.3 — 2.3 — 5.1 — 13 — 381 — 956 — 2370 — 4800 — 12410 — 176 — 760 — 2120 — 4500 — 12130 Notes at 105 °C IDD_LLS Low-leakage stop mode current at 3.
General 1. The analog supply current is the sum of the active or disabled current for each of the analog modules on the device. See each module's specification for its supply current. 2. MCG configured for PEE mode. CoreMark benchmark compiled using Keil 4.54 with optimization level 3, optimized for time. 3. MCG configured for FEI mode. 4. Incremental current consumption from peripheral activity is not included. 5. MCG configured for BLPI mode. 6. No brownout Table 10.
General Table 10. Low power mode peripheral adders — typical value (continued) Symbol Description Temperature (°C) Unit -40 25 50 70 85 105 86 86 86 86 86 86 235 256 265 274 280 287 • MCGIRCLK (4 MHz internal reference clock) • OSCERCLK (4 MHz external crystal) ITPM TPM peripheral adder measured by placing the device in STOP or VLPS mode with selected clock source configured for output compare generating 100 Hz clock signal. No load is placed on the I/O generating the clock signal.
General Run Mode Current Vs Core Frequency Temperature = 25, VDD = 3, CACHE = Enable, Code Residence = Flash, Clocking Mode = FBE 8.00E-03 7.00E-03 Current Consumption on VDD(A) 6.00E-03 5.00E-03 All Peripheral CLK Gates 4.00E-03 All Off All On 3.00E-03 2.00E-03 1.00E-03 000.00E+00 '1-1 '1-1 '1-1 '1-1 '1-1 '1-1 '1-1 '1-2 1 2 3 4 6 12 24 48 CLK Ratio Flash-Core Core Freq (MHz) Figure 2. Run mode supply current vs. core frequency 14 Freescale Semiconductor, Inc.
General VLPR Mode Current Vs Core Frequency Temperature = 25, V DD = 3, CACHE = Enable, Code Residence = Flash, Clocking Mode = BLPE 400.00E-06 Current Consumption on VDD (A) 350.00E-06 300.00E-06 250.00E-06 All Peripheral CLK Gates 200.00E-06 All Off All On 150.00E-06 100.00E-06 50.00E-06 000.00E+00 '1-1 '1-2 1 '1-2 '1-4 2 4 CLK Ratio Flash-Core Core Freq (MHz) Figure 3. VLPR mode current vs. core frequency 2.2.6 EMC radiated emissions operating behaviors Table 11.
General application code. The reported emission level is the value of the maximum measured emission, rounded up to the next whole number, from among the measured orientations in each frequency range. 2. VDD = 3.3 V, TA = 25 °C, fOSC = 8 MHz (crystal), fSYS = 48 MHz, fBUS = 48 MHz 3. Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband TEM Cell Method 2.2.
General Table 13. Device clock specifications (continued) Symbol fERCLK Description Min. Max. Unit — 16 MHz — 16 MHz Oscillator crystal or resonator frequency — high frequency mode (high range) (MCG_C2[RANGE]=1x) — 16 MHz TPM asynchronous clock — 8 MHz UART0 asynchronous clock — 8 MHz External reference clock fLPTMR_ERCLK LPTMR external reference clock fosc_hi_2 fTPM fUART0 1.
Peripheral operating requirements and behaviors 2.4.2 Thermal attributes Table 16. Thermal attributes Board type Symbol Single-layer (1S) RθJA Four-layer (2s2p) Description 80 LQFP 64 LQFP 48 QFN 32 QFN Unit Notes Thermal resistance, junction to ambient (natural convection) 70 71 84 92 °C/W 1 RθJA Thermal resistance, junction to ambient (natural convection) 53 52 28 33 °C/W Single-layer (1S) RθJMA Thermal resistance, junction to ambient (200 ft./min.
Peripheral operating requirements and behaviors 3.1.1 SWD electricals Table 17. SWD full voltage range electricals Symbol J1 Description Min. Max. Unit Operating voltage 1.71 3.
Peripheral operating requirements and behaviors SWD_CLK J9 SWD_DIO J10 Input data valid J11 SWD_DIO Output data valid J12 SWD_DIO J11 SWD_DIO Output data valid Figure 5. Serial wire data timing 3.2 System modules There are no specifications necessary for the device's system modules. 3.3 Clock modules 3.3.1 MCG specifications Table 18. MCG specifications Symbol Description Min. Typ. Max.
Peripheral operating requirements and behaviors Table 18. MCG specifications (continued) Symbol Description Min. Typ. Max. Unit Notes Δfdco_t Total deviation of trimmed average DCO output frequency over voltage and temperature — +0.5/-0.7 ±3 %fdco 1, 2 Δfdco_t Total deviation of trimmed average DCO output frequency over fixed voltage and temperature range of 0–70 °C — ± 0.4 ± 1.
Peripheral operating requirements and behaviors Table 18. MCG specifications (continued) Symbol Description Min. Jacc_pll PLL accumulated jitter over 1µs (RMS) Typ. Max. Unit 10 • fvco = 48 MHz — 1350 — ps • fvco = 100 MHz — 600 — ps Dlock Lock entry frequency tolerance ± 1.49 — ± 2.98 % Dunl Lock exit frequency tolerance ± 4.47 — ± 5.97 % tpll_lock Lock detector detection time Notes — — 10-6 150 × + 1075(1/ fpll_ref) s 11 1.
Peripheral operating requirements and behaviors Table 19. Oscillator DC electrical specifications (continued) Symbol Description • 24 MHz Min. Typ. Max. Unit — 1.5 — mA Notes • 32 MHz IDDOSC Supply current — high gain mode (HGO=1) 1 • 32 kHz — 25 — μA • 4 MHz — 400 — μA • 8 MHz (RANGE=01) — 500 — μA • 16 MHz — 2.
Peripheral operating requirements and behaviors 3. Cx,Cy can be provided by using the integrated capacitors when the low frequency oscillator (RANGE = 00) is used. For all other cases external capacitors must be used. 4. When low power mode is selected, RF is integrated and must not be attached externally. 5. The EXTAL and XTAL pins should only be connected to required oscillator components and must not be connected to any other devices. 3.3.2.2 Symbol Oscillator frequency specifications Table 20.
Peripheral operating requirements and behaviors 3.4.1.1 Flash timing specifications — program and erase The following specifications represent the amount of time the internal charge pumps are active and do not include command overhead. Table 21. NVM program/erase timing specifications Symbol Description Min. Typ. Max. Unit thvpgm4 Notes Longword Program high-voltage time — 7.
Peripheral operating requirements and behaviors 3.4.1.4 Symbol Reliability specifications Table 24. NVM reliability specifications Description Min. Typ.1 Max. Unit Notes Program Flash tnvmretp10k Data retention after up to 10 K cycles 5 50 — years tnvmretp1k Data retention after up to 1 K cycles 20 100 — years nnvmcycp Cycling endurance 10 K 50 K — cycles 2 1.
Peripheral operating requirements and behaviors Table 25. 16-bit ADC operating conditions (continued) Symbol Description VADIN Input voltage CADIN RADIN RAS Input capacitance Min. Typ.1 Max.
Peripheral operating requirements and behaviors SIMPLIFIED INPUT PIN EQUIVALENT CIRCUIT ZADIN SIMPLIFIED CHANNEL SELECT CIRCUIT Pad leakage due to input protection ZAS RAS ADC SAR ENGINE RADIN VADIN CAS VAS RADIN INPUT PIN RADIN INPUT PIN RADIN INPUT PIN CADIN Figure 6. ADC input impedance equivalency diagram 3.6.1.2 16-bit ADC electrical characteristics Table 26.
Peripheral operating requirements and behaviors Table 26. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA) (continued) Symbol INL Description Integral nonlinearity EFS Full-scale error EQ Quantization error ENOB Conditions1 Min. Typ.2 Max. Unit Notes –2.7 to +1.9 LSB4 5 LSB4 VADIN = VDDA5 • 12-bit modes — ±1.0 • <12-bit modes — ±0.5 • 12-bit modes — –4 –5.4 • <12-bit modes — –1.4 –1.8 • 16-bit modes — –1 to 0 — • ≤13-bit modes — — ±0.5 12.8 14.5 — bits 11.
Peripheral operating requirements and behaviors 1. All accuracy numbers assume the ADC is calibrated with VREFH = VDDA 2. Typical values assume VDDA = 3.0 V, Temp = 25 °C, fADCK = 2.0 MHz unless otherwise stated. Typical values are for reference only and are not tested in production. 3. The ADC supply current depends on the ADC conversion clock speed, conversion rate and ADC_CFG1[ADLPC] (low power).
Peripheral operating requirements and behaviors 3.6.2 CMP and 6-bit DAC electrical specifications Table 27. Comparator and 6-bit DAC electrical specifications Symbol Description Min. Typ. Max. Unit VDD Supply voltage 1.71 — 3.
Peripheral operating requirements and behaviors CMP Hysteresis vs Vinn 90.00E-03 80.00E-03 70.00E-03 CMP Hysteresis (V) 60.00E-03 HYSTCTR Setting 50.00E-03 0 1 40.00E-03 2 3 30.00E-03 20.00E-03 10.00E-03 000.00E+00 0.1 0.4 0.7 1 1.3 1.6 1.9 2.2 2.5 2.8 3.1 Vinn (V) Figure 9. Typical hysteresis vs. Vin level (VDD = 3.3 V, PMODE = 0) CMP Hysteresis vs Vinn 180.00E-03 160.00E-03 140.00E-03 CMP Hysteresis (V) 120.00E-03 HYSTCTR Setting 100.00E-03 0 1 80.00E-03 2 3 60.
Peripheral operating requirements and behaviors 3.6.3.2 Symbol 12-bit DAC operating behaviors Table 29. 12-bit DAC operating behaviors Description IDDA_DACL Supply current — low-power mode Min. Typ. Max. Unit — — 250 μA — — 900 μA Notes P IDDA_DACH Supply current — high-speed mode P tDACLP Full-scale settling time (0x080 to 0xF7F) — low-power mode — 100 200 μs 1 tDACHP Full-scale settling time (0x080 to 0xF7F) — high-power mode — 15 30 μs 1 — 0.
Peripheral operating requirements and behaviors 8 6 4 DAC12 INL (LSB) 2 0 -2 -4 -6 -8 0 500 1000 1500 2000 2500 3000 3500 4000 Digital Code Figure 11. Typical INL error vs. digital code 34 Freescale Semiconductor, Inc. Kinetis KL25 Sub-Family, Rev4 03/2014.
Peripheral operating requirements and behaviors 1.499 DAC12 Mid Level Code Voltage 1.4985 1.498 1.4975 1.497 1.4965 1.496 -40 55 25 85 105 125 Temperature °C Figure 12. Offset at half scale vs. temperature 3.7 Timers See General switching specifications. 3.8 Communication interfaces 3.8.1 USB electrical specifications The USB electricals for the USB On-the-Go module conform to the standards documented by the Universal Serial Bus Implementers Forum.
Peripheral operating requirements and behaviors 3.8.2 USB VREG electrical specifications Table 30. USB VREG electrical specifications Symbol Description Min. Typ.1 Max. Unit VREGIN Input supply voltage 2.7 — 5.5 V IDDon Quiescent current — Run mode, load current equal zero, input supply (VREGIN) > 3.6 V — 125 186 μA IDDstby Quiescent current — Standby mode, load current equal zero — 1.1 10 μA IDDoff Quiescent current — Shutdown mode — 650 — nA — — 4 μA • VREGIN = 5.
Peripheral operating requirements and behaviors All timing is shown with respect to 20% VDD and 80% VDD thresholds, unless noted, as well as input signal transitions of 3 ns and a 30 pF maximum load on all SPI pins. Table 31. SPI master mode timing on slew rate disabled pads Num. Symbol 1 fop 2 tSPSCK 3 tLead 4 tLag 5 tWSPSCK 6 tSU 7 Min. Max.
Peripheral operating requirements and behaviors SS 1 (OUTPUT) 3 2 SPSCK (CPOL=0) (OUTPUT) 10 11 10 11 4 5 5 SPSCK (CPOL=1) (OUTPUT) 6 MISO (INPUT) 7 MSB IN 2 BIT 6 . . . 1 LSB IN 8 MOSI (OUTPUT) MSB OUT 2 9 BIT 6 . . . 1 LSB OUT 1. If configured as an output. 2. LSBF = 0. For LSBF = 1, bit order is LSB, bit 1, ..., bit 6, MSB. Figure 13.
Peripheral operating requirements and behaviors Table 33. SPI slave mode timing on slew rate disabled pads (continued) Num. Symbol 4 tLag 5 tWSPSCK 6 tSU Data setup time (inputs) 7 tHI Data hold time (inputs) 8 ta Slave access time 9 tdis Slave MISO disable time 10 tv 11 12 13 1. 2. 3. 4. Description Min. Max.
Peripheral operating requirements and behaviors SS (INPUT) 2 12 13 12 13 4 SPSCK (CPOL=0) (INPUT) 5 3 SPSCK (CPOL=1) (INPUT) 5 9 8 see note MISO (OUTPUT) SLAVE MSB 6 MOSI (INPUT) 10 11 11 BIT 6 . . . 1 SLAVE LSB OUT SEE NOTE 7 MSB IN BIT 6 . . . 1 LSB IN NOTE: Not defined Figure 15. SPI slave mode timing (CPHA = 0) SS (INPUT) 4 2 3 SPSCK (CPOL=0) (INPUT) 5 SPSCK (CPOL=1) (INPUT) 5 see note SLAVE 8 MSB OUT 6 MOSI (INPUT) 13 12 13 11 10 MISO (OUTPUT) 12 9 BIT 6 . .
Peripheral operating requirements and behaviors 3.8.4 Inter-Integrated Circuit Interface (I2C) timing Table 35. I2C timing Characteristic Symbol Standard Mode Fast Mode Unit Minimum Maximum Minimum Maximum SCL Clock Frequency fSCL 0 100 0 4001 kHz Hold time (repeated) START condition. After this period, the first clock pulse is generated. tHD; STA 4 — 0.6 — µs LOW period of the SCL clock tLOW 4.7 — 1.3 — µs HIGH period of the SCL clock tHIGH 4 — 0.
Dimensions 3.8.5 UART See General switching specifications. 3.9 Human-machine interfaces (HMI) 3.9.1 TSI electrical specifications Table 36. TSI electrical specifications Symbol Description Min. Typ. Max. Unit TSI_RUNF Fixed power consumption in run mode — 100 — µA TSI_RUNV Variable power consumption in run mode (depends on oscillator's current selection) 1.0 — 128 µA TSI_EN Power consumption in enable mode — 100 — µA TSI_DIS Power consumption in disable mode — 1.
Pinout 5 Pinout 5.1 KL25 Signal Multiplexing and Pin Assignments The following table shows the signals available on each pin and the locations of these pins on the devices supported by this document. The Port Control Module is responsible for selecting which ALT functionality is available on each pin.
Pinout 80 64 LQFP LQFP 48 QFN 32 QFN Pin Name Default — PTE24 DISABLED ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 20 15 25 21 16 — PTE25 DISABLED 26 22 17 10 PTA0 SWD_CLK TSI0_CH1 27 23 18 11 PTA1 DISABLED TSI0_CH2 PTA1 UART0_RX TPM2_CH0 28 24 19 12 PTA2 DISABLED TSI0_CH3 PTA2 UART0_TX TPM2_CH1 29 25 20 13 PTA3 SWD_DIO TSI0_CH4 PTA3 I2C1_SCL TPM0_CH0 SWD_DIO 30 26 21 14 PTA4 NMI_b TSI0_CH5 PTA4 I2C1_SDA TPM0_CH1 NMI_b 31 27 — — PTA5 DISABLED PT
Pinout 80 64 LQFP LQFP 48 QFN 32 QFN Pin Name Default ALT0 ALT1 57 45 35 23 PTC2 ADC0_SE11/ ADC0_SE11/ PTC2 TSI0_CH15 TSI0_CH15 58 46 36 24 PTC3/ LLWU_P7 DISABLED 59 47 — — VSS VSS VSS 60 48 — — VDD VDD VDD 61 49 37 25 PTC4/ LLWU_P8 DISABLED PTC4/ LLWU_P8 62 50 38 26 PTC5/ LLWU_P9 DISABLED 63 51 39 27 PTC6/ LLWU_P10 CMP0_IN0 64 52 40 28 PTC7 65 53 — — PTC8 66 54 — — 67 55 — 68 56 69 ALT2 ALT3 I2C1_SDA PTC3/ LLWU_P7 ALT4 ALT5 ALT7
PTD7 PTD6/LLWU_P15 PTD5 PTD4/LLWU_P14 PTD3 PTD2 PTD1 PTD0 PTC17 PTC16 PTC13 PTC12 PTC11 PTC10 PTC9 PTC8 PTC7 PTC6/LLWU_P10 PTC5/LLWU_P9 PTC4/LLWU_P8 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 Pinout PTB10 PTE20 13 48 PTB9 PTE21 14 47 PTB8 PTE22 15 46 PTB3 PTE23 16 45 PTB2 VDDA 17 44 PTB1 VREFH 18 43 PTB0/LLWU_P5 VREFL 19 42 PTA20 VSSA 20 41 PTA19 40 49 PTA18 12 39 VREGIN VSS PTB11 38 50 VDD 11 37 VOUT33
PTD7 PTD6/LLWU_P15 PTD5 PTD4/LLWU_P14 PTD3 PTD2 PTD1 PTD0 PTC11 PTC10 PTC9 PTC8 PTC7 PTC6/LLWU_P10 PTC5/LLWU_P9 PTC4/LLWU_P8 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 Pinout PTB18 PTE20 9 40 PTB17 PTE21 10 39 PTB16 PTE22 11 38 PTB3 PTE23 12 37 PTB2 VDDA 13 36 PTB1 VREFH 14 35 PTB0/LLWU_P5 VREFL 15 34 PTA20 VSSA 16 33 PTA19 PTA18 32 41 31 8 VSS VREGIN 30 PTB19 VDD 42 29 7 PTA13 VOUT33 28 PTC0 PTA12 43 27 6 PTA5 USB0
PTD7 PTD6/LLWU_P15 PTD5 PTD4/LLWU_P14 PTD3 PTD2 PTD1 PTD0 PTC7 PTC6/LLWU_P10 PTC5/LLWU_P9 PTC4/LLWU_P8 48 47 46 45 44 43 42 41 40 39 38 37 Pinout PTB16 PTE20 7 30 PTB3 PTE21 8 29 PTB2 VDDA 9 28 PTB1 VREFH 10 27 PTB0/LLWU_P5 VREFL 11 26 PTA20 VSSA 12 25 PTA19 PTA18 24 31 23 6 VSS VREGIN 22 PTB17 VDD 32 21 5 PTA4 VOUT33 20 PTC0 PTA3 33 19 4 PTA2 USB0_DM 18 PTC1/LLWU_P6/RTC_CLKIN PTA1 34 17 3 PTA0 USB0_DP 16 PTC2 PTE25 35 15
PTD7 PTD6/LLWU_P15 PTD5 PTD4/LLWU_P14 PTC7 PTC6/LLWU_P10 PTC5/LLWU_P9 PTC4/LLWU_P8 32 31 30 29 28 27 26 25 Ordering parts 21 PTB1 VOUT33 5 20 PTB0/LLWU_P5 VREGIN 6 19 PTA20 VDDA 7 18 PTA19 VSSA 8 17 PTA18 PTA0 PTE30 16 4 VSS USB0_DM 15 PTC1/LLWU_P6/RTC_CLKIN VDD 22 14 3 PTA4 USB0_DP 13 PTC2 PTA3 23 12 2 PTA2 VSS 11 PTC3/LLWU_P7 PTA1 24 10 1 9 PTE0 Figure 21. KL25 32-pin QFN pinout diagram 6 Ordering parts 6.
Part identification 7.1 Description Part numbers for the chip have fields that identify the specific part. You can use the values of these fields to determine the specific part you have received. 7.2 Format Part numbers for this device have the following format: Q KL## A FFF R T PP CC N 7.3 Fields This table lists the possible values for each field in the part number (not all combinations are valid): Table 37.
Terminology and guidelines 7.4 Example This is an example part number: MKL25Z64VLK4 8 Terminology and guidelines 8.1 Definition: Operating requirement An operating requirement is a specified value or range of values for a technical characteristic that you must guarantee during operation to avoid incorrect operation and possibly decreasing the useful life of the chip. 8.1.1 Example This is an example of an operating requirement: Symbol VDD Description 1.0 V core supply voltage Min. 0.9 Max. 1.
Terminology and guidelines 8.3 Definition: Attribute An attribute is a specified value or range of values for a technical characteristic that are guaranteed, regardless of whether you meet the operating requirements. 8.3.1 Example This is an example of an attribute: Symbol CIN_D Description Input capacitance: digital pins Min. — Max. 7 Unit pF 8.
Terminology and guidelines 8.5 Result of exceeding a rating 40 Failures in time (ppm) 30 The likelihood of permanent chip failure increases rapidly as soon as a characteristic begins to exceed one of its operating ratings. 20 10 0 Operating rating Measured characteristic 8.6 Relationship between ratings and operating requirements g Op g in rat tin era nt ) in. (m me ire era Op g tin .) ) in. (m nt me ire u req g tin era Op ax (m .
Terminology and guidelines 8.8 Definition: Typical value A typical value is a specified value for a technical characteristic that: • Lies within the range of values specified by the operating behavior • Given the typical manufacturing process, is representative of that characteristic during operation when you meet the typical-value conditions or other specified conditions Typical values are provided as design guidelines and are neither tested nor guaranteed. 8.8.
Revision history 5000 4500 4000 TJ IDD_STOP (μA) 3500 150 °C 3000 105 °C 2500 25 °C 2000 –40 °C 1500 1000 500 0 0.90 0.95 1.05 1.00 1.10 VDD (V) 8.9 Typical value conditions Typical values assume you meet the following conditions (or other conditions as specified): Table 38. Typical value conditions Symbol Description Value Unit TA Ambient temperature 25 °C VDD 3.3 V supply voltage 3.3 V 9 Revision history The following table provides a revision history for this document.
Revision history Table 39. Revision history Rev. No. Date Substantial Changes • • • • • • • • • • • • 56 Freescale Semiconductor, Inc.
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