Datasheet

Appendix A Electrical Characteristics
MC9S08SG8 MCU Series Data Sheet, Rev. 8
304 Freescale Semiconductor
Conversion
time (including
sample time)
Short sample
(ADLSMP=0)
Dt
ADC
—20 —
ADCK
cycles
xx
See ADC
Chapter
for
conversion
time
variances
Long sample
(ADLSMP=1)
—40 —
xx
Sample time
Short sample
(ADLSMP=0)
Dt
ADS
—3.5 —
ADCK
cycles
xx
Long sample
(ADLSMP=1)
—23.5 —
xx
Total
unadjusted
error (Includes
quantization)
10 bit mode
PE
TUE
— 1.5 3.5 LSB
2
xx
8 bit mode — 0.7 1.5 LSB
3
xx
Differential
Non-Linearity
10 bit mode
PDNL
— 0.5 1.0
LSB
3
xx
8 bit mode — 0.3 0.5
xx
Monotonicity and No-Missing-Codes guaranteed
Integral
non-linearity
10 bit mode
TINL
— 0.5 1.0
LSB
3
xx
8 bit mode — 0.3 0.5
xx
Zero-scale
error
10 bit mode
PE
ZS
— 1.5 2.5
LSB
3
xx
8 bit mode — 0.5 0.7 x x
Full-scale error
(V
ADIN
= V
DD
)
10 bit mode
TE
FS
0 1.0 1.5
LSB
3
xx
8 bit mode 0 0.5 0.5
xx
Quantization
error
10 bit mode
DE
Q
——0.5
LSB
3
xx
8 bit mode — — 0.5
xx
Input leakage
error
10 bit mode
DE
IL
0 0.2 2.5
LSB
3
xx Pad
leakage
3
*
R
AS
8 bit mode 0 0.1 1
xx
Temp sensor
slope
–40C to 25C
Dm
—3.266 —
mV/C
xx
25C to 125C — 3.638 — x x
Temp sensor
voltage
25CD
V
TEMP
25
—1.396 — V x x
1
Typical values assume V
DD
= 5.0 V, Temp = 25C, f
ADCK
= 1.0 MHz unless otherwise stated. Typical values are for reference
only and are not tested in production.
2
Electrical characteristics only apply to the temperature rated devices marked with x.
3
Based on input pad leakage current. Refer to pad electricals.
Table A-12. ADC Characteristics (continued)
Characteristic Conditions C Symb Min Typ
1
Max Unit
Temp Rated
2
Comment
Stand
ard
AEC
Grade
0