Datasheet

PMLL4148L_PMLL4448 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 8 — 1 February 2011 5 of 11
NXP Semiconductors
PMLL4148L; PMLL4448
High-speed switching diodes
8. Test information
f=1MHz; T
j
=25°C
Fig 5. Diode capacitance as a function of reverse voltage; typical values
01020
1.2
1.0
0.6
0.4
0.8
mgd004
V
R
(V)
C
d
(pF)
(1) I
R
=1mA
Input signal: reverse pulse rise time t
r
= 0.6 ns; reverse voltage pulse duration t
p
= 100 ns; duty cycle δ≤0.05
Oscilloscope: rise time t
r
=0.35ns
Fig 6. Reverse recovery time test circuit and waveforms
Input signal: forward pulse rise time t
r
= 20 ns; forward current pulse duration t
p
≥ 100 ns; duty cycle δ≤0.005
Fig 7. Forward recovery voltage test circuit and waveforms
t
rr
(1)
+ I
F
t
output signal
t
r
t
p
t
10 %
90 %
V
R
input signal
V = V
R
+ I
F
× R
S
R
S
= 50 Ω
I
F
D.U.T.
R
i
= 50 Ω
SAMPLING
OSCILLOSCOPE
mga881
t
r
t
t
p
10 %
90 %
I
input signal
R
S
= 50 Ω
I
R
i
= 50 Ω
OSCILLOSCOPE
1 kΩ 450 Ω
D.U.T.
mga88
2
V
FR
t
output signal
V