Datasheet

NCL30100
http://onsemi.com
3
Figure 2. Simplified Circuit Architecture
IVC
CT
CS
GND
V
CC
DRV
Input Voltage
Regulator
0−3.9 V
50 mA
12.5−50 mA
Q
Q
SET
CLR
S
R
Reset
Set
Reference
Regulator
VDD
Iref
Undervoltage
Lockout
6.35/5.85 V
OFF Time
Comparator
VOffset
Current Sense
Comparator
Gate Driver
MAXIMUM RATINGS
Rating Symbol Value Unit
Power Supply Voltage V
CC
18 V
IVC Pins Voltage Range IVC −0.3 to 18 V
CS and C
T
Pin Voltage Range V
in
−0.3 to 10 V
Thermal Resistance, Junction−to−Air
R
q
JA
178 °C/W
Junction Temperature T
J
150 °C
Storage Temperature Range T
stg
−60 to +150 °C
ESD Voltage Protection, Human Body Model (HBM) V
ESD−HBM
2 kV
ESD Voltage Protection, Machine Model (MM) V
ESD−MM
200 V
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. This device(s) contains ESD protection and exceeds the following tests:
Human Body Model 2000 V per JEDEC Standard JESD22−A114E
Machine Model 200 V per JEDEC Standard JESD22−A115−A
2. This device meets latchup tests defined by JEDEC Standard JESD78.
3. Moisture Sensitivity Level (MSL) 1.