Schematics Part 1

DEKRA Certification, Inc.
405 Glenn Dr. Suite 12,
Sterling, VA 20164
United States of America
Report No: 2271ERM.007A1
Page 13 of 181
02-20-2019
DESCRIPTION OF TEST CONDITIONS
TEST
CONDITIONS
DESCRIPTION
TC#01
(1)
(a mode)
Power supply (V):
V
nominal
= 12 Vdc
Test Frequencies for Conducted/Radiated tests: (20 MHz)
Lowest range: 5180 MHz
Middle channel: 5220 MHz
Highest range: 5240 MHz
TC#02
(1)
(n mode)
Power supply (V):
V
nominal
= 12 Vdc
Test Frequencies for Conducted/Radiated tests: (20 MHz)
Lowest channel: 5180 MHz
Middle channel: 5220 MHz
Highest channel: 5240 MHz
Test Frequencies for Conducted/Radiated tests: (40 MHz)
Lowest channel: 5180 MHz
Highest channel: 5240 MHz
TC#03
(1)
(ac mode)
Power supply (V):
V
nominal
= 12 Vdc
Test Frequencies for Conducted/Radiated tests: (20 MHz)
Lowest channel: 5180 MHz
Middle channel: 5220 MHz
Highest channel: 5240 MHz
Test Frequencies for Conducted/Radiated tests: (40 MHz)
Lowest channel: 5180 MHz
Highest channel: 5240 MHz
Test Frequencies for Conducted/Radiated tests: (80 MHz)
Middle channel: 5180 MHz
Note (1): For spurious emissions for OFDM modes 802.11a, 802.11n20/40 and 802.11ac20/40/80 a
preliminary scan was performed to determine the worst case.
The data rates of 6Mb/s for 802.11a, HT0 (SISO) for 802.11n20/ac20 and n40/ac40, and VHT0 (SISO)
for 802.11 ac80 were selected based on preliminary testing that identified those rates corresponding to
the worst cases.