Datasheet

34 PMK Produktkatalog 2008 © Copyright PMK 2008
34
Micro Test Accessories 0.64 mm
Clamp-type Test Probes
Order-No.
Type of contact
Clamping range
Type of termination
Rated Voltage
Rated Current
Contact resistance
Contact material
Contact surface material
Housing material
Temperature Range
Inflammability class
MICRO-KLEPS
973972100 (black)
973972101 (red)
rotating grip jaws
2 mm
2 x pin 0.64 mm
DC 60 V
2 A
10 mΩ
spring steel
nickel-plated
PBT
-25 °C to +100 °C
94 HB
KLEPS 3 ST
973592100 (black)
973592101 (red)
rotating grip jaws
3.5 mm
pin 0.64 mm
DC 60 V
2 A
10 mΩ
spring steel
nickel-plated
PBT
-25 °C to +100 °C
94 HB
MICRO-SMD Clip 1
972416100 (black)
SMD Clip
0 mm to 8 mm
2 x pin 0.64 mm
DC 60 V
–
6 mΩ
copper Beryllium (CuBe)
gold-plated
PBT
-30 °C to +100 °C
94 HB
Miniature clamp-type test probe
with rotating grip jaws (SMD
technology). The insulated shaft
can be bent up to 35°. Suitable for
very thin wires and densely packed
contact points (1.27 mm IC spacing
pitch). Connects with MKL and
MAL measuring leads.
Miniature clamp-type test probe
with rotating grip jaws. Suitable
for very thin wires and densely
packed contacts. Connects with
MKL and MAL measuring leads.
Spring-loaded, two-pole test clip,
specially designed for SMD com-
ponents. Gold-plated, hardened
tip for testing circuits, flat-nosed
grips for individual components;
notch for gripping thin wires. Ba-
lanced spring force permits testing
of large and small components;
0.64 mm pin connection; electri-
cally insulated spring.