User guide

PNIASIC
Specifications
Electrical Specifications
Parameter voltage and current levels
Testing for the currents listed in
Table 4 assume a static test setup with measurements performed while
static data is applied to the device. Test type parameters apply as listed in the
Table 8: Pin Definitions
Table 4: Inputs
Test Type Vil
a
Vih
a
Iil
b
Iih
b
AIB (analog input) 0.2 Vdd 2.0 Vdd 0.0 to -1.0 µA 0.0 to 1.0 µA
IBA (CMOS) 0.25 Vdd 0.8 Vdd 0.0 to -1.0 µA 0.0 to 1.0 µA
IBT (CMOS, SC
Hsy = 1.0)
c
0.2 Vdd 0.8 Vdd 0.0 to -1.0 µA 0.0 to 1.0 µA
a. CMOS values are V
IN
x V
DD
.
b. Iil and Iih are tested at V
DD
= 3.6 V. Not tested at less than room temperature.
c. SC = Schmitt
Table 5: Outputs
Test Type Vol Voh Iol
a
Ioh
a
OB 1
b
<0.4 V >2.4 V 1.0 mA minimum -1.0 mA minimum
OB 2
b
<0.4 V >2.4 V 1.0 mA minimum -1.0 mA minimum
OB 3
c
0.267 V 1.936 V 10 mA minimum 10 mA minimum
a. Polarity on currents indicate direction of current ( + ) for sinking ( - ) for sourcing.
b. V
DD
= 4.5 to 5.0 V
c. V
DD
= 2.2 V
Table 6: I/O Pins
Test
Type
Vil
a
Vih
a
Vol
b
Voh
b
Iol
b
Ioh
b
Ioz
c
Ioz
c
IO1A
CMOS
<.30 V >.70V <0.40 V 4.1 V -0.64 mA -0.15 mA 39µA
minimum
217 µA
maximum
a. CMOS values are V
IN
x V
DD
.
b. Tested at V
DD
= 4.8 V
c. Tested with V
DD
= 5.2 V. Leakage on I/O pins is typically checked for ± 2 µA with the ouput device turned off and no
PU or PD.
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