Specifications

EMC-CS-2009.1

February 11, 2010

14.3 Test Procedures

Testing shall be repeated for all DUT operating modes listed in the EMC test plan.

Activate the DUT and verify that it is functioning correctly.

Place an individual DUT circuit wire or wire pairs (i.e. twisted wire pair) in the test fixture (circuit placement

requirements are identical to RI130)

At each test frequency increase the peak to peak current to the corresponding stress level listed in Figure 14-1. Use the

frequency steps listed in Table 14-1.

• Dwell time shall be 10 seconds. A longer dwell time may be necessary if DUT function response times are

expected to be longer. This information shall be documented in the EMC test plan.

Monitor DUT functions before, during, and after application of the stress levels in Figure 14-1 and verify that no

performance deviations occur (i.e. Status I).

Table 14-1: RI 150 Test Frequency Requirements

Test Frequency Range (kHz) Frequency Step (kHz)

> 1 – 10 0.5

> 10 – 100 5