Specifications

EMC-CS-2009.1
© Copyright Ford Motor Company – All Rights Reserved Page 64 of 121
February 11, 2010
17.0 Immunity from Power Cycling: CI 230
These requirements are applicable to the following component categories:
Electronic Modules: A, AM, AX, AY
Electric Motors: EM
17.1 Requirements
The component shall be immune from voltage fluctuations, which occur during initial start of the vehicle’s engine under cold
temperature conditions.
This requirement is not representative of conditions where a warm engine is restarted. The voltage
waveforms representing these fluctuations are illustrated in Figure 17-1. Specific application of these waveforms is
dependent on the method used to connect the component’s power supply and control circuits. Application requirements for
each waveform are listed in Table 17-1 along with the performance requirements for the component.
Table 17-1: CI 230 Power Cycling Requirements
Functional Performance Status
(2)
Waveform
(1)
Application Duration
Class A Class B Class C
A
Power & control circuits connected to
battery via the IGN 1 (RUN) contact of the
ignition switch. (i.e. circuits active in RUN
but not START).
II II II
B
Power & control circuits connected to
battery via the IGN 2 (RUN/START)
contact of the ignition switch (i.e. circuits
active during RUN and START). Also
includes connections to battery through a
relay switch.
II II II
C
Power & control circuits connected to
battery via the START contact of the
ignition switch. (i.e. circuits active only
during engine START).
II II II
D
Power & control circuits connected directly
to Battery
2 cycles
separated
by cooling
period
II II II
1 Waveforms applied simultaneously to all power supply and control circuits.
2
Any degradation in performance shall not inhibit the ability of the vehicle to start.
17.2 Test Verification and Test Setup
Testing shall be performed using the test Setup shown in Figure 17-2.
• The test harness connecting the DUT to the Load Simulator and transient pulse generator shall be < 2000 mm in
length.
• Testing shall be performed at -40 +0 / - 5 degrees C or the coldest temperature specified in component's engineering
specification. The temperature shall be documented in the EMC test plan.
• The DUT shall be placed on a dielectric support 50 mm above the metal floor of the thermal chamber.