User guide

Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
A
CAGE NO.
51774
QT824, QT825 and QT826
Sine-Wave 32 Flat Pack
REV.
E
Page 5 of 10
A: For Frequencies between 75.1 MHz and 150 MHz phase noise degrades between 6 dbc/Hz to 10
dbc/Hz
B: For Frequencies between 150.1 MHz and 210 MHz phase noise degrades between 10 dbc/Hz to
13 dbc/Hz
C: For Frequencies between 210.5 MHz and 225 MHz phase noise degrades 14 dbc/Hz
Group B Inspection
Testing shall be performed after completion of Frequency Aging and before parts are
shipped
SUB-
GROUP
TEST DESCRIPTION CONDITION QTY
1 Frequency Aging
MIL-PRF-55310
Para 3.6.34.2
100%
2
Hermetic Seal 1/
Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C
100%
3 Electrical 1/ (Go/NoGo) 100%
Group A Inspection
(Testing is performed on a 100% basis)
PARAMETER SYMB
OL
CONDITIONS VALUE UNIT
Input Current, max. Is
Vs, nom. / Ta=+25C
30 for
Vs= 12
and 15V
55 for
Vs= 5
and 3.3V
mA
Freq. stability vs. Operating
Temperature
f/fc
(Ta)
Vs, nominal and over the operating
temperature range indicated under part
number definition
indicated under
part number
definition
ppm
Electrical Frequency
Adjustment Min.
(when specified)
f/fo
(Vcc)
± Vs, nom. / Ta=+25C as indicated
under part number definition
indicated under
part number
definition
ppm
Output level Min.
Sine Class S, 100 krads (Si) total dose
Min
indicated under
part number
definition
dBm
Harmonics/Harmonicas, Max. ± Vs, nom. / Ta=+25C -30 dBc
Phase noise @ freq. offset
(Output Frequency up to
75 MHz)
See notes: A,B and C
below
£ (f)
£ (f)
£ (f)
£ (f)
£ (f)
± Vs, nom. / Ta=+25C
f=10Hz
f=100Hz
f=1kHz
f=10kHz
f=100kHz
-80
-110
-135
-155
-155
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
External Visual
MIL-STD-883, Method 2009