REVISIONS REVISION 1.0 DESCRIPTION APPROVED Preliminary Luis Vargas DATE 8/13/2010 GENERAL RELEASE DOCUMENT CONSULT FACTORY FOR CURRENT REVISION SPECIFICATION CONTROL DRAWING PREPARED BY: DATE Q-TECH CORPORATION 10150 W. JEFFERSON BLVD. CULVER CITY, CA 90232-3510 UNLESS OTHERWISE SPECIFIED, DIMENSIONS ARE IN INCHES. TOLERANCES: 3 PLACE DECIMAL = .005 2 PLACE DECIMAL = .02 1 PLACE DECIMAL = .
1.0 SCOPE This specification establishes the detail requirements for low profile hybrid, hermetically sealed, SineWave output Voltage Controlled crystal oscillators (VCXO) for use in space flight missions. 2.0 APPLICABLE DOCUMENTS The following documents of the latest issue form a part of this drawing to the extent specified herein. 2.
.1.1 Electrical Characteristics PARAMETER Frequency Nom. SYMBOL fo - Supply voltage, Nom. Vs Vs±5% Is Vs, nom. / Ta=+25°C Vc/fo, and 50Ω load Input Current, max. Overall Frequency stability (including Operating Temperature, ±5% Load Change, ±5% Supply Voltage change. 10 year aging, and radiation) Voltage Control Range For Frequency Adjustment Min. Control Voltage at which fo will occur at 25°C Frequency Pulling range, Min Linearity, max. Input impedance, min. Modulation freq.
Random Vibration Shock Acceleration Altitude Radiation Electrostatic Discharge Sensitivity 3.3 MIL-STD-202, Method 214 TC “I-K” (15 minutes per axis) MIL-STD-202, Method 213, TC “F” MIL-STD-883, Method 2001, TC “A” 50,000 feet minimum to deep space Radiation testing is not performed, but these VCXOs have been acceptable for use in environments up to 100K rads by analysis of the components used. Only bipolar semiconductors are employed. A copy of the parts list and materials can be provided for review.
Active elements a) Visual inspection of silicon on sapphire microcircuits. Semicircular crack(s) or multiple adjacent cracks, not in the active area, starting and terminating at the edge of the die are acceptable. Attached (chip in place) sapphire is nonconductive material and shall not be considered as foreign material and will be considered as nonconductive material for all inspection criteria. b) Subgroup 4, Scanning Electron Microscope (SEM) inspection.
a) Assembly drawing(s). b) All electrical schematics and drawings not considered proprietary. c) The assembly and screening travelers to be used on-line to manufacture the devices supplied to this specification. d) Parts and materials list. 3.7 Test Report A test report is supplied with each shipment of oscillators and includes the following information, as a minimum: a) A Certificate of Conformance to all specifications and purchase order requirements.
▀ PART NUMBER GENERATION Output type and supply voltage SERIES QTV71: 4: SINE WAVE +3dBm ..5V 24 Pin Flat Pack 5: SINE WAVE +7dBm ….12V 6: SINE WAVE +7dBm ..15V TEMPERATURE RANGE (°C)/ Max. Overall Stability/ Min. Frequency Pulling and Voltage Control Range N: 0.....+50°C ±25 ppm ±50 ppm Vc=0.5..4.5V E: Eng. Model P: 0.....+70°C ±35 ppm M: Flight Model Q: 20…+70°C ±40 ppm ±80 ppm Vc=0.5..6.0V R: 40…+85°C ±45 ppm ±90 ppm Vc=0.5..6.0V U: -55.+125°C ±65 ppm ±130 ppm Vc=0.5..6.0V ±70 ppm Vc=0.
