Specifications

Corresponding author: Cai, H. (caihui35806505@163.com)

Source title: Materials Letters

Abbreviated source title: Mater Lett

Volume: 93

Issue date: 2013

Publication year: 2013

Pages: 263-265

Language: English

ISSN: 0167577X

CODEN: MLETDJ

Document type: Journal article (JA)

Publisher: Elsevier, P.O. Box 211, Amsterdam, 1000 AE, Netherlands

Abstract: We prepared various porous structures on magnesium substrates by microarc

oxidation (MAO) pretreatment in different solutions, and then controllably deposited electroless

nickel (EN) layers on them under identical plating conditions. The results indicate that the

microstructures, electrical and electrochemical properties of EN layers are highly dependent on

the porous surface. Thin layer including tiny nickel granule is deposited on

NaF-solution-pretreated substrates, but thick layer, consisting of typical nickel nodule, is formed

on substrates oxidized in Na2SiO3 solution, while excellent electrical conductivity and corrosion

resistance are obtained. Whereas, the reticular-structured layers with wormlike nickel as well as

high thickness and resistivity are area-selectively deposited on the substrate pretreated in

Number of references: 11

Main heading: Substrates

Controlled terms: Corrosion resistance - Deposits - Electric conductivity -

Electric properties - Electrochemical properties - Magnesium - Microstructure -

Nickel - Sodium

Uncontrolled terms: Controlled deposition - Electrical conductivity - Electroless

nickel - Electroless nickel layer - Magnesium substrates - Microarc - Microarc

oxidation - Plating conditions - Porous structures - Porous surface -

Pre-Treatment - Thick layers - Thin layers

Classification code: 951 Materials Science - 933 Solid State Physics - 801.4.1

Electrochemistry - 801 Chemistry - 701.1 Electricity: Basic Concepts and Phenomena -

617 Turbines and Steam Turbines - 612 Engines - 549.2 Alkaline Earth Metals - 549.1

Alkali Metals - 548.1 Nickel - 539.1 Metals Corrosion - 532 Metallurgical Furnaces -

461 Bioengineering and Biology

DOI: 10.1016/j.matlet.2012.11.112

Database: Compendex

Accession number: 20130215877088

Title: TEM characterization of Si films grown on 6H-SiC (0001) C-face

Authors: Li, Lianbi1, 2 ; Chen, Zhiming1 ; Xie, Longfei1 ; Yang, Chen1/李连碧;陈治明;谢龙

飞;杨陈