Specifications

2 Xi'an Sunrise Technology Co Ltd, Xi'an 710002, China
Corresponding author: Chen, W.-G. ([e-mail])
Source title: Cailiao Rechuli Xuebao/Transactions of Materials and Heat Treatment
Abbreviated source title: Cailiao Rechuli Xuebao
Volume: 34
Issue: 4
Issue date: April 2013
Publication year: 2013
Pages: 95-99
Language: Chinese
ISSN: 10096264
CODEN: JRXUDO
Document type: Journal article (JA)
Publisher: Editorial Office of Transactions of Materials, 18 Xueqing Road, Beijing, 100083, China
Abstract: Influence of carbon and sulfur in the atmosphere of coal firing on properties of
welded 310S stainless steel before and after high-temperature aging treatment was studied by
means of OM, SEM/EDX, XRD and impact and tensile tests. The results show that the aged
sample by the different heat treatment suffers more severe corrosion than the unaged sample.
The formation of σ phase due to aging treatment above 700°C, redues Cr content around grain
boundaries in 310S stainless steel, which results in the decrease of corrosion resistance of 310S
stainless steel. At the same time, grain grows, impact toughness is reduced significantly, and
fracture mode changes from microvoid coalescence ductile fracture to cleavage fracture.
Number of references: 12
Main heading: Stainless steel
Controlled terms: Aging of materials - Brittle fracture - Carbon - Coalescence -
Corrosion resistance - Ductile fracture - Grain boundaries - Sulfur - Tensile testing
- Welding
Uncontrolled terms: Aging treatment - Cleavage fracture - Coal firing - Cr content -
Fracture mode - High temperature aging - Severe corrosion - Tensile tests
Classification code: 804 Chemical Products Generally - 801.3 Colloid Chemistry - 545.3
Steel - 933.1 Crystalline Solids - 539.1 Metals Corrosion - 422.2 Strength of Building
Materials : Test Methods - 421 Strength of Building Materials; Mechanical Properties -
538.2 Welding
Database: Compendex
Compilation and indexing terms, © 2013 Elsevier Inc.
2.
Accession number: 20132016323583
Title: Phenylene-thiophene oligomer derivatives for thin-film Transistors: Structure and
semiconductor performances
Authors: Duan, Zongfan1, 2 ; Ohuchi, Hirokuni2 ; Yanagi, Yuichiro2 ; Takayanagi, Yutaro2 ; Zhao,
Gaoyang1 ; Nishioka, Yasushiro2/段宗范;;;
Author affiliation: 1 School of Materials Science and Engineering, Xi'an University of
Technology, Xi'an, Shaanxi 710048, China