Specifications
malicious nodes. We use the Rough set classifier to replace the method by settings of the
threshold. The innovation of the paper is to improve the computation accuracy and the efficiency
of the classification computation by using Rough set combined with SVM classifier. In the cases
that with the value of one or two attributes the corresponding classification result can be
determined, we use the Rough set classifier. In other cases, we use SVM classifier. Compared with
the existing security model, the simulation results indicate that the model can obtain higher
examination rate over malicious nodes and the higher transaction success rate. © 2013 ISSN
1881-803X.
Number of references: 9
Main heading: Rough set theory
Controlled terms: Computational efficiency - Learning systems - Network security
- Support vector machines
Uncontrolled terms: Classification results - Computation accuracy - Inductive
reasoning - Malicious nodes - Rough set - Security model - SVM classifiers -
SVM(support vector machine)
Classification code: 723 Computer Software, Data Handling and Applications - 921
Mathematics - 921.4 Combinatorial Mathematics, Includes Graph Theory, Set Theory
Database: Compendex
Compilation and indexing terms, © 2013 Elsevier Inc.
4.
Accession number: 20130315905159
Title: Using an external electric field to reduce laser damage of DLC films
Authors: Wu, Shen-Jiang1, 2 ; Shi, Wei1 ; Su, Jun-Hong2/吴慎将;施卫;苏俊宏
Author affiliation:
1 Department of Applied Physics, Xi'an University of Technology, Xi'an 710048, China
2 Key Laboratory of Film Technology and Optical Measurement, Xi'an Technological University,
Xi'an 710032, China
Corresponding author: Wu, S.-J. (bxait@xatu.edu.cn)
Source title: International Journal of Materials and Product Technology
Abbreviated source title: Int J Mater Prod Technol
Volume: 45
Issue: 1-4
Issue date: 2012
Publication year: 2012
Pages: 74-82
Language: English
ISSN: 02681900
CODEN: IJMTE2
Document type: Journal article (JA)
Publisher: Inderscience Enterprises Ltd., Editorial Office, P O Box 735, Olney, Bucks.,
MK46 5WB, MK46 5WB, United Kingdom
Abstract: Unbalanced magnetron sputtering (UBMS) was used to deposit a diamond-like
carbon (DLC) film on Si substrates. The film was subjected to a laser to result damages both
before and after an external electric field was applied. A contrast of the damages shows that the