Specifications

paper.X-ray diffraction analysis and scanning electronic microscopy were used to characterize the
crystal structure and morphology of the deposited silicon layer. Results of I-V and C-V
measurements indicated that the heterojunction was abrupt manifesting obvious p-n junction
properties. During the I-V measurement, the Si/SiC heterojunction developed a remarkable
photovoltaic effect under illumination condition. © 2013 Published by Elsevier Ltd.
Number of references: 11
Main heading: Heterojunctions
Controlled terms: Chemical vapor deposition - Electric properties - Silicon - Silicon
carbide - Vapors
Uncontrolled terms: Boron-doped silicon - C-V measurement - Crystal structure and
morphology - Diffraction analysis - I-V measurements - Illumination
conditions - Scanning electronic microscopy - Si/6h-sic heterojunctions
Classification code: 701.1 Electricity: Basic Concepts and Phenomena - 712.1.1 Single
Element Semiconducting Materials - 714.2 Semiconductor Devices and Integrated
Circuits - 802.2 Chemical Reactions - 804 Chemical Products Generally - 804.2 Inorganic
Compounds
DOI: 10.1016/j.mssp.2013.03.008
Database: Compendex
Compilation and indexing terms, © 2013 Elsevier Inc.
4.
Accession number: 20133216592760
Title: A generic construction of proxy signatures from certificateless signatures
Authors: Zhang, Lei1 ; Wu, Qianhong2, 3 ; Qin, Bo2, 4 ; Domingo-Ferrer, Josep2 ; Zeng,
Peng1 ; Liu, Jianwei5 ; Du, Ruiying3/;伍前;秦波;
Author affiliation:
1 Shanghai Key Laboratory of Trustworthy Computing, Software Engineering Institute, East
China Normal University, Shanghai, China
2 Department of Computer Engineering and Mathematics, Universitat Rovira i Virgili,
Tarragona, Catalonia, Spain
3 Key Lab. of Aerospace Information Security and Trusted Computing Ministry of Education,
Wuhan University, School of Computer, China
4 Department of Maths, School of Science, Xi'an University of Technology, China
5 School of Electronic and Information Engineering, Beijing University of Aeronautics and
Astronautics, China
Source title: Proceedings - International Conference on Advanced Information Networking
and Applications, AINA
Abbreviated source title: Proc. Int. Conf. Adv. Inf. Netw. Appl. AINA
Monograph title: Proceedings - IEEE International Conference on Advanced Information
Networking and Applications, AINA 2013
Issue date: 2013
Publication year: 2013
Pages: 259-266
Article number: 6531764
Language: English