Specifications

Author affiliation:
1 Department of Electronic Engineering, Xi'an University of Technology, Xi'an 710048, China
Corresponding author: Ma, J. ([e-mail])
Source title: Taiyangneng Xuebao/Acta Energiae Solaris Sinica
Abbreviated source title: Taiyangneng Xuebao
Volume: 34
Issue: 6
Issue date: June 2013
Publication year: 2013
Pages: 1010-1014
Language: Chinese
ISSN: 02540096
CODEN: TYNPDG
Document type: Journal article (JA)
Publisher: Science Press, 18,Shuangqing Street,Haidian, Beijing, 100085, China
Abstract: CuInS2 thin films were prepared by sulfurization of the Cu-In metallic precursors in
sulfur atmosphere, the influences of annealing temperature and annealing time on the films
properties were studied. Characterization of The relationship between the microstructure,
composition and optical properties of CuInS2 thin films and the preparation process was
investigated by X-ray diffraction(XRD), energy dispersive spectroscopy(EDS) and
spectrophotometer. The results explicitly revealed that the proper annealing conditions can
improve the crystallization of the films and remove the binary impure phase effectively; the In
and S elements of the films would loss at the conditions of high annealing temperature and long
time annealing process. The optical properties of the films are excellent, the samples absorption
coefficient as high as 104cm-1 were obtained.
Number of references: 8
Main heading: Film preparation
Controlled terms: Annealing - Copper - Energy dispersive spectroscopy - Optical
properties - Thin films - X ray diffraction
Uncontrolled terms: Absorption co-efficient - Annealing condition - Annealing
temperatures - Energy dispersive spectroscopies (EDS) - Metallic
precursor - Precursor - Preparation process - Sulfurization
Classification code: 931.3 Atomic and Molecular Physics - 801 Chemistry - 741.1
Light/Optics - 714.2 Semiconductor Devices and Integrated Circuits - 712.1 Semiconducting
Materials - 544.1 Copper - 537.1 Heat Treatment Processes
Database: Compendex
Compilation and indexing terms, © 2013 Elsevier Inc.
10.
Accession number: 20133516668901
Title: Fault-tolerant mining algorithm of sampling data from dynamic system
Authors: Shaolin, Hu1, 2 ; Ye, Li2 ; Dong, Zhang1/胡绍林;李晔;张冬
Author affiliation:
1 State Key Laboratory of Astronautics, P.O. Box 505-16, Xi'an 710043, China