User guide

30
3674E–DFLASH–8/08
AT25DF081
Notes: 1. Not 100% tested (value guaranteed by design and characterization).
12.7 Input Test Waveforms and Measurement Levels
12.8 Output Test Load
12.5 Program and Erase Characteristics
Symbol Parameter Min Typ Max Units
t
PP
Page Program Time (256 Bytes) 1.0 5.0 ms
t
BP
Byte Program Time 15 µs
t
BLKE
Block Erase Time
4-Kbyte 50 200
ms32-Kbyte 350 600
64-Kbyte 600 950
t
CHPE
(1)
Chip Erase Time 8 14 sec
t
WRSR
(1)
Write Status Register Time 200 ns
12.6 Power-Up Conditions
Symbol Parameter Min Max Units
t
VCSL
Minimum V
CC
to Chip Select Low Time 70 µs
t
PUW
Power-up Device Delay Before Program or Erase Allowed 10 ms
V
POR
Power-On Reset Voltage 0.9 1.1 V
AC
DRIVING
LEVELS
AC
MEASUREMENT
LEVEL
0.1V
CC
V
CC
/2
0.9V
CC
t
R
, t
F
< 2 ns (10% to 90%)
DEVICE
UNDER
TEST
30 pF