Datasheet

Rev.7.00 Feb. 14, 2007 page xiv of xxxii
REJ09B0089-0700
Item Page Revision (See Manual for Details)
20.3.6 Flash Memory
Characteristics
Table 20.29 Flash
Memory
Characteristics
860 Table 20.29 amended
Item Symbol Min Typ Max Unit Test Conditions
Number of overwrites NWEC 100
*
3
10000
*
5
— Times
Data retention time
*
4
t
DRP
10 — — Years
Note 5 added
Note: 5. Reference value for 25°C (as a guideline, rewriting
should normally function up to this value).
Appendix E Products
Lineup
Table E.1 H8S/2319
Group Products Lineup
1103 Table E.1 amended
HD64F2319E*
1
H8S/2317(S)*
2
1104 Notes amended
Notes: 1. The on-chip debug function can be used with the
E10A emulator (E10A compatible version).
2. H8S/2317S in mask ROM version.
F. Package
Dimensions
Figure F.4 TLP-113V
Package Dimensions
Figure F.4 replaced
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