Datasheet

Section 22 Electrical Characteristics
Rev. 4.00 Mar. 15, 2006 Page 459 of 556
REJ09B0026-0400
Values
Item Symbol
Test
Condition
Min. Typ. Max. Unit
Erasing Wait time after SWE bit
setting*
1
x 1 — — µs
Wait time after ESU bit
setting*
1
y 100 — — µs
Wait time after E bit
setting*
1
*
6
z 10 — 100 ms
Wait time after E bit clear*
1
α 10 — — µs
Wait time after ESU bit
clear*
1
β 10 — — µs
Wait time after EV bit
setting*
1
γ 20 — — µs
Wait time after dummy
write*
1
ε 2 — — µs
Wait time after EV bit clear*
1
η 4 — — µs
Wait time after SWE bit
clear*
1
θ 100 — — µs
Maximum erase count *
1
*
6
*
7
N — — 120 Times
Notes: 1. Make the time settings in accordance with the program/erase algorithms.
2. The programming time for 128 bytes. (Indicates the total time for which the P bit in the
flash memory control register 1 (FLMCR1) is set. The program-verify time is not
included.)
3. The time required to erase one block. (Indicates the time for which the E bit in the flash
memory control register 1 (FLMCR1) is set. The erase-verify time is not included.)
4. Programming time maximum value (t
P
(max.)) = wait time after P bit setting (z) ×
maximum programming count (N)
5. Set the maximum programming count (N) according to the actual set values of z1, z2,
and z3, so that it does not exceed the programming time maximum value (t
P
(max.)).
The wait time after P bit setting (z1, z2) should be changed as follows according to the
value of the programming count (n).
Programming count (n)
1 ≤ n ≤ 6 z1 = 30 µs
7 ≤ n ≤ 1000 z2 = 200 µs
6. Erase time maximum value (t
E
(max.)) = wait time after E bit setting (z) × maximum
erase count (N)
7. Set the maximum erase count (N) according to the actual set value of (z), so that it
does not exceed the erase time maximum value (t
E
(max.)).