Datasheet

Table Of Contents
Section 26 Electrical Characteristics
Rev. 2.00 Jul. 04, 2007 Page 575 of 692
REJ09B0309-0200
5. Set the maximum programming count (N) according to the actual set values of z1, z2,
and z3, so that it does not exceed the programming time maximum value (t
P
(max.)).
The wait time after setting P bit (z1, z2) should be changed as follows according to the
value of the programming count (n).
Programming count (n)
1 n 6 z1 = 30 µs
7 n 1000 z2 = 200 µs
6. Erasing time maximum value (t
E
(max.)) = wait time after setting E bit (z) × maximum
erasing count (N)
7. Set the maximum erasing count (N) according to the actual set value of (z), so that it
does not exceed the erasing time maximum value (t
E
(max.)).
8. The minimum number of times in which all characteristics are guaranteed following
reprogramming. (The guarantee covers the range from 1 to the minimum value.)
9. Reference value at 25°C. (Guideline showing programming count over which
functioning will be retained under normal circumstances.)
10. Data retention characteristics within the range indicated in the specifications, including
the minimum programming count.
11. Applies to an operating voltage range when reading data of 2.7 to 3.6 V.
12. Applies to an operating voltage range when reading data of 1.8 to 3.6 V.
26.3 Absolute Maximum Ratings for Masked ROM Version
Table 26.11 lists the absolute maximum ratings.
Table 26.11 Absolute Maximum Ratings
Item Symbol Value Unit Note
Power supply voltage V
CC
–0.3 to +4.3 V
Analog power supply voltage AV
CC
–0.3 to +4.3 V
Other than port B V
in
–0.3 to V
CC
+0.3 V Input voltage
Port B AV
in
–0.3 to AV
CC
+0.3 V
–20 to +75
(regular specifications)
Operating temperature T
opr
–40 to +85
(wide-range specifications)
°C
*
Storage temperature T
stg
–55 to +125 °C
Note: * Permanent damage may occur to the chip if absolute maximum ratings are exceeded.
Normal operation should be under the conditions specified in Electrical Characteristics.
Exceeding these values can result in incorrect operation and reduced reliability.