Brochure

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Versatile near-field probe sets
Near-field probes are used to analyze EMC problems
in electronic circuits and to identify their causes.
Rohde & Schwarz offers several near-field probe sets
that include E-field and H-field probes for use with oscil-
loscopes, signal and spectrum analyzers and EMI test
receivers.
The R&S®HZ-14 active near-field probe set has a particu-
larly low frequency limit of 9kHz and provides high sensi-
tivity thanks to its integrated amplifier.
The R&S®HZ-15 E and H near-field probeset consists of
several passive near-field probes that are ideal for diagnos-
ing EMC problems on printed boards. The compact design
facilitates localization of EMI sources down to the individu-
al conductors. The optional R&S®HZ-16 preamplifier offers
20dB gain for greater sensitivity in the frequency range
from 100kHz to 3GHz.
The R&S®HZ-17 H field probe set is an economic near-field
probe set for EMI debugging when E field measurements
are not required.
EMC near-field
probes
Powerful E and H near-field probes for the frequency
range from 9kHz to 3GHz with optional preamplifier
expand the application range of the R&S®RTO
oscilloscopes to include EMI debugging.
Direct acquisition and analysis of sporadically occurring EMI thanks to the R&S®RTO
oscilloscope's powerful spectrum analysis function
Model Frequency range Comment Order No.
Near-field probe
R&S®HZ-14 9 kHz to 1 GHz active E and H near-field probe set,
requires R&S®HZ-9 external power
supply
1026.7744.03
R&S®HZ-15 30 MHz to 3GHz compact E and H near-field probe set 1147.2736.02
R&S®HZ-17 30 MHz to 3 GHz compact H near-field probe set 1339.4141.02
Accessories
R&S®HZ-16 100kHz to 3GHz preamplifier 3GHz, 20dB,
power adapter 100 V to 230 V
1147.2720.02
R&S®HZ-9 external power supply for R&S®HZ-14 0816.1015.03
R&S®RTO oscilloscope's powerful FFT analysis
function
The R&S®RTO oscilloscope's powerful FFT function permits
for the first time debugging of EMI problems using an os-
cilloscope. Developers now have a cost-effective solution
for EMI debugging right on their lab bench. Unwanted
EMI can be displayed simultaneously in both the time and
frequency domain, speeding up debugging.
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