Instruction manual

Page 3 of 100 Report No. 255837
TRF No. IEC60335_2_40F
Testing procedure and testing location:
CB/CCA Testing Laboratory:
N/A
Testing location/ address ........................ :
Associated CB Laboratory:
N/A
Testing location/ address ........................ :
Tested by (name + signature) ....... :
Approved by (+ signature) ............. :
Testing procedure: TMP
Tested by (name + signature) ....... :
Jae Hyeon, Kim
Approved by (+ signature) ..............:
Jae Hong, Park
Testing location/ address ........................ :
Samsung Electronics Co., Ltd.
Digital Air-solutions Business Team,
129, Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do,
443-742 Korea, Republic of
Testing procedure: WMT N/A
Tested by (name + signature) ....... :
Witnessed by (+ signature) ............:
Approved by (+ signature) ............. :
Testing location/ address ........................ :
Testing procedure: SMT N/A
Tested by (name + signature) ....... :
Approved by (+ signature) .............. :
Supervised by (+ signature) .......... :
Testing location/ address ........................ :
Testing procedure: RMT N/A
Tested by (name + signature) ....... :
Approved by (+ signature) .............. :
Supervised by (+ signature) .......... :
Testing location/ address ........................ :