Data Sheet

CC2541
SWRS110D –JANUARY 2012–REVISED JUNE 2013 www.ti.com
RSSI CHARACTERISTICS
Measured on Texas Instruments CC2541 EM reference design with T
A
= 25°C and VDD = 3 V
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
2 Mbps, GFSK, 320-kHz Deviation, 0.1% BER and 2 Mbps, GFSK, 500-kHz Deviation, 0.1% BER
Reduced gain by AGC algorithm 64
Useful RSSI range
(1)
dB
High gain by AGC algorithm 64
Reduced gain by AGC algorithm 79
RSSI offset
(1)
dBm
High gain by AGC algorithm 99
Absolute uncalibrated accuracy
(1)
±6 dB
Step size (LSB value) 1 dB
All Other Rates/Formats
Standard mode 64
Useful RSSI range
(1)
dB
High-gain mode 64
Standard mode 98
RSSI offset
(1)
dBm
High-gain mode 107
Absolute uncalibrated accuracy
(1)
±3 dB
Step size (LSB value) 1 dB
(1) Assuming CC2541 EM reference design. Other RF designs give an offset from the reported value.
FREQUENCY SYNTHESIZER CHARACTERISTICS
Measured on Texas Instruments CC2541 EM reference design with T
A
= 25°C, VDD = 3 V and f
c
= 2440 MHz
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
At ±1-MHz offset from carrier –109
Phase noise, unmodulated carrier At ±3-MHz offset from carrier –112 dBc/Hz
At ±5-MHz offset from carrier –119
ANALOG TEMPERATURE SENSOR
Measured on Texas Instruments CC2541 EM reference design with T
A
= 25°C and VDD = 3 V
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Output 1480 12-bit
Temperature coefficient 4.5 / 1°C
Voltage coefficient 1 0.1 V
Measured using integrated ADC, internal band-gap voltage
reference, and maximum resolution
Initial accuracy without calibration ±10 °C
Accuracy using 1-point calibration ±5 °C
Current consumption when enabled 0.5 mA
COMPARATOR CHARACTERISTICS
T
A
= 25°C, VDD = 3 V. All measurement results are obtained using the CC2541 reference designs, post-calibration.
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Common-mode maximum voltage VDD V
Common-mode minimum voltage –0.3
Input offset voltage 1 mV
Offset vs temperature 16 µV/°C
Offset vs operating voltage 4 mV/V
Supply current 230 nA
Hysteresis 0.15 mV
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