Datasheet

Sensors
NXP Semiconductors 9
MMA8452Q
Figure 5. I
2
C slave timing diagram
2.4 Absolute maximum ratings
Stresses above those listed as absolute maximum ratings may cause permanent damage to the device. Exposure to maximum
rating conditions for extended periods may affect device reliability.
Table 5. Maximum ratings
Rating Symbol Value Unit
Maximum acceleration (all axes, 100 μs) g
max
5,000 g
Supply voltage VDD –0.3 to + 3.6 V
Input voltage on any control pin (SA0, SCL, SDA) Vin –0.3 to VDDIO + 0.3 V
Drop test D
drop
1.8 m
Operating temperature range T
OP
–40 to +85 °C
Storage temperature range T
STG
–40 to +125 °C
Table 6. ESD and latchup protection characteristics
Rating Symbol Value Unit
Human body model HBM ±2000 V
Machine model MM ±200 V
Charge device model CDM ±500 V
Latchup current at T = 85°C
— ±100 mA
V
IL
= 0.3V
DD
V
IH
= 0.7V
DD
This device is sensitive to mechanical shock. Improper handling can cause permanent damage of the part or
cause the part to otherwise fail.
This device is sensitive to ESD, improper handling can cause permanent damage to the part.