Data Sheet

655
Atmel | SMART SAM D21 [DATASHEET]
Atmel-42181G–SAM-D21_Datasheet–09/2015
In addition as shown in Figure 30-2 on page 652, six optional independent and successive units primarily intended for
use with different types of motor control, ballast, LED, H-bridge, power converter, and other types of power switching
applications, are implemented in some of TCC instances.
The output matrix (OTMX) can distribute and route out the TCC waveform outputs across the port pins in different
configurations, each optimized for different application types.
The dead time insertion (DTI) unit splits the four lower OTMX outputs into two non-overlapping signals, the non-inverted
low side (LS) and inverted high side (HS) of the waveform output with optional dead-time insertion between LS and HS
switching.
The swap (SWAP) unit can be used to swap the LS and HS pin outputs, and can be used for fast decay motor control.
The pattern generation unit can be used to generate synchronized waveforms with constant logic level on TCC update
conditions. This is for example useful for easy stepper motor and full bridge control.
The non-recoverable fault module enables event controlled fault protection by acting directly on the generated
waveforms from timer/counter compare channels output. When a non-recoverable fault condition is detected, the output
waveforms are forced to a safe and pre-configured value that is safe for the application. This is typically used for instant
and predictable shut down and disabling high current or voltage drives.
The count event sources (TCE0 and TCE1) are shared with the non-recoverable fault extension. The events can be
optionally filtered. If the filter options are not used, the non-recoverable faults provide an immediate asynchronous action
on waveform output, even for cases where the clock is not present. For further details on how to configure asynchronous
events routing, refer to section “EVSYS – Event System” on page 406.