User`s manual

Setting Measurement Conditions
3-16
3
(8) Artifact processing
Artifact processing is a method of processing that eliminates the false detection of the edge of the
target object when an artifact is in the line being scanned. This process can be used during edge
detection. The real edge of the target object is detected by computing the average duration of the dark
area in the scan line, which is much longer for a target object than for an artifact.
Example of detection
An example of light to dark averaging (DTCT MODE:BRT DRK) while scanning horizontally
(SEARCH DIR:HORIZ ), with artifact processing (enabled) (ARTIF).
When artifact processing is disabled (NO ARTIF) in the above example, the edge detection
point changes.
Measurement programs which are affected by these settings
Positional deviation measurement (edge detection), lead inspection, and multiple position
measurement (edge detection).
Edge detection point
(with artifact processing: enabled)
Average light (vertical)
Duration of dark area
in the line scan
Edge detection point (with artifact processing off)
Setting the threshold value automatically
By executing an "AUTO.REG" (automatic
setting) for the edge detection condition in
each measurement program, the IV-S30 can
automatically detect edges in the
measurement areas, and set the optimum
threshold values automatically (density
difference and edge width).
Measurement programs which are affected
by these settings
Positional deviation measurement (edge
detection), lead inspection, multiple position
measurement (edge detection).
THRESHOLD VAL AUTO-REG RESET
F C1 BRT
1
GRYS 050(0~255)
2
EDGE.W 2(1~8)
3
FLAT.W 04(1~16)
SET=CHNG ESC=BACK SEL=CHNG IMG TRG=FUNC
• Edge delection menu of the lead inspection