Specifications

Si4730/31/34/35-D60
18 Rev. 1.1
Table 12. Reference Clock and Crystal Characteristics
(V
A
= 2.7 to 5.5 V, V
D
= 1.62 to 3.6 V, T
A
= –20 to 85 °C)
Parameter Symbol Test Condition Min Typ Max Unit
Reference Clock
RCLK Supported Frequencies
1
31.130 32.768 40,000 kHz
RCLK Frequency Tolerance
2
–100 — 100 ppm
REFCLK_PRESCALE 1 — 4095
REFCLK 31.130 32.768 34.406 kHz
Crystal Oscillator
Crystal Oscillator Frequency — 32.768 — kHz
Crystal Frequency Tolerance
2
–100 — 100 ppm
Board Capacitance — — 3.5 pF
ESR — — 50 
CL
3
71222pF
CL–single ended
3
14 24 44 pF
Notes:
1. The Si473x-D60 divides the RCLK input by REFCLK_PRESCALE to obtain REFCLK. There are some RCLK
frequencies between 31.130 kHz and 40 MHz that are not supported. For more details, see Table 6 of “AN332: Si47xx
Programming Guide”.
2. A frequency tolerance of ±50 ppm is required for FM seek/tune using 50 kHz channel spacing and AM seek/tune in SW
frequencies.
3. Guaranteed by characterization.
Table 13. Thermal Conditions
Parameter Symbol Min Typ Max Unit
Thermal Resistance* 
JA
—80—°C/W
Ambient Temperature T
A
–15 25 85 °C
Junction Temperature T
J
——92°C
*Note: Thermal resistance assumes a multi-layer PCB with the exposed pad soldered to a topside PCB pad.