Datasheet
DATASHEET
SMT172
last update
juni 1, 2015
reference
V10.0
page
2/9
Absolute Maximum Rating
T
A
= 25°C. All voltages are referenced to GND, unless otherwise noted.
Power supply voltage -0.5 V to 7 V
Output Pin load 50 mA
ESD protection (HBM) +2000 V
Junction temperature +200 °C
Soldering temperature (SOIC, SOT) +260 °C (10 s)
Specification
T
A
= -45°C to 130°C, Vcc=2.7 V to 5.5 V, unless otherwise noted.
Parameter
ParameterParameter
Parameter
Min
MinMin
Min
Typ
TypTyp
Typ
Max
MaxMax
Max
Unit
UnitUnit
Unit
Conditions
ConditionsConditions
Conditions
Supply Voltage 2.7
5.5 V
Active current
1
50 µA T
A
= -45 °C, Vcc = 2.7 V, no load at the output pin
60 µA T
A
= 25 °C, Vcc = 3.3 V, no load at the output pin
70 µA T
A
= 25 °C, Vcc = 5.5 V, no load at the output pin
Average current 220 nA
T
A
= 25 °C, Vcc = 3.3 V, one sample per second, each sample is
based on average of 16 output periods.
Power down current 1 µA
When controlling with dedicated PD pin (only SOIC),
Vcc = 3.3 V
0 µA When controlling with Vcc pin
Inaccuracy
2
0.25 °C -10 °C to 100 °C (TO18)
0.8 °C -45 °C to 130 °C (TO18)
Noise
3
0.002 °C T
A
= 25 °C, Vcc = 5 V, 3.6 ms measurement time
Output frequency 0.5 7 kHz frequency range is 1 - 4 kHz for Vcc 4.7-5.5 V.
PSRR at DC 0.1 °C/V
Repeatability
4
0.01 °C T
A
= 25°C
Startup time 1 2 ms after PD and/or Vcc, start measurement on first negative edge
Long term drift 0.05 °C Measured under 200 °C stress test condition for 48 h
Output impedance 100 Ω
Operating Temperature -45 130 °C
Storage Temperature -50 150 °C
1
Continuous conversion
2
TO-18 package, all errors included. For other types of package, see section “understanding the specifications”-“package induced
error”. For an inaccuracy of 0.1 °C another conversion formula is needed (see page 6).
3
Noise level will be reduced by averaging multiple consecutive samples, for instance noise can be reduced to 0.0004
o
C by taking
average in 0.1s, so the measurement time should always be provided when mentioning noise figures. The lower limit of the noise is
determined by the flicker noise of the sensor, where further averaging will no longer reduce the noise.
4
Repeatability is defined as difference between multiple measurements on the same temperature point during multiple temperature
cycles.