Datasheet

ManualsBrandsTE Connectivity - AMP ManualsConnectorsCrimp Socket, 26 ... 24AWG, Tin

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2018

TE Connectivity

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Product

Specification

This controlled document is subject to change.

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PRODUCT INFORMATION 1-800-522-6752

108-10042

15 NOV 18 Rev G

Type III+ Stamped and Formed Contacts

1. SCOPE

1.1. Content

This specification covers the performance, tests and quality requirements for TE Connectivity (TE)

crimp Type III+, stamped and formed contacts. These contacts are used in connectors and other

electronic components and are primarily intended for use where coupling means is provided

separately from individual contact.

1.2. Qualification

When tests are performed on the subject product line, the procedures specified in Figure 1 shall be

used. All inspections shall be performed using the applicable inspection plan and product drawing.

1.3. Successful qualification testing on the subject product line was completed on 26Jan88. The

Qualification Test Report number for this testing is 501-66. This documentation is on file at and

available from Engineering Practices and Standards (EPS).

2. APPLICABLE DO CUM ENTS

The following documents form a part of this specification to the extent specified herein. In the event

of conflict between the requirements of this specification and the product drawing, the product

drawing shall take precedence. In the event of conflict between the requirements of this specification

and the referenced documents, this specification shall take precedence.

2.1. TE Documents

109-1: Test Specification (General Requirements for Test Specifications)

109 Series: Test Specifications as indicated in Figure 1

114-10004: Application Specification (Type III+ (Size 16) Contacts)

501-66: Qualification Test Report (Type III+ Stamped and Formed Contacts)

2.2. Military Specification

MIL-W -16878/1 and /4: W ire, Electrical, Insulated, High Temperature

2.3. Reference Document

502-1288: Engineering Report, Evaluation Testing of PdNi plating of Type III+ Pin Contacts

502-134263: Engineering Report, Evaluation Testing of PdNi plating of Type III+ Socket Contacts

3. REQ UIREM ENTS

3.1. Design and Construction

Product shall be of the design, construction physical dimensions and materials specified on the

applicable product drawing.

3.2. Rating

— Current/Voltage: The continuous current rating for individual contacts cannot be applied directly

to the number of contacts as they are dependent on the thermal and physical properties of the

material. System design shall assure that continuous current rating does not create internal hot

spots that exceed the temperature designated by the connector specification, during steady

state or transient conditions.

— Operating temperature:

• -55 to 150°C for precious metal plated contacts

• -55 to 90°C for tin plated contacts

Summary of content (5 pages)

PAGE 1
Product Specification 108-10042 15 NOV 18 Rev G Type III+ Stamped and Formed Contacts 1. SCOPE 1.1. Content This specification covers the performance, tests and quality requirements for TE Connectivity (TE) crimp Type III+, stamped and formed contacts. These contacts are used in connectors and other electronic components and are primarily intended for use where coupling means is provided separately from individual contact. 1.2.
PAGE 2
108-10042 3.3. Test Requirements and Procedures Summary Unless otherwise specified, all tests shall be performed at ambient environmental Test Description Examination of product. Requirements Meet requirements of product drawing and Application Specification 114-10004. Procedure EIA 364-18B Visual, dimensional and functional per applicable inspection plan. ELECTRICAL Termination resistance, specified current. See Figure 4. EIA 364-6C Measure potential drop of mated contacts after stabilizing.
PAGE 3
108-10042 Test Description Requirements Procedure ENVIRO NMENTAL Thermal shock. Shall show no evidence of dam age; meet termination resistance, dry circuit; termination resistance, specified current; and engaging and separating force. EIA 364-32G Subject mated contacts to 10 cycles between -55 and 90°C for tin plated contacts and -55 and 150°C for precious metal plated contacts. Humidity/temperature cycling. Termination resistance, dry circuit; engaging and separating force.
PAGE 4
108-10042 NOTE Termination resistance equals millivolts divided by test current less resistance of 4.5 inches of wire. Figure 3 Termination Resistance Measurement Test Circuit Mating End Size W ire Size (AW G ) Test Current (amperes) Resistance (milliohm s maxim um ) 14 17 6.00 16 & 1mm2 18 & 16 13 6.50 0.75mm2 10 7.50 20 7.5 9.00 22 5.0 9.50 24 3.0 14.5 26 2.0 19.0 28 1.5 30.0 30 1.2 43.
PAGE 5
108-10042 Figure 5 Contact Engagement and Separation Force G age Number Contact Size A B Maxim um Flat 1 16 .0615 +.0001/-.0000 .015 2 16 .0635 +.0000/-.0001 .