Datasheet
108-10042
Rev G
3
of
5
Test Description Requirements Procedure
E
N
V
I
R
O
N
M
E
NT
A
L
Thermal shock. Shall show no evidence of dam age; meet
termination resistance, dry circuit; termination
resistance, specified current; and engaging
and separating force.
EIA 364-32G
Subject mated contacts to 10 cycles
between -55 and 90°C for tin plated
contacts and -55 and 150°C for precious
metal plated contacts.
Humidity/temperature cycling. Termination resistance, dry circuit;
engaging and separating force.
EIA 364-31D, Method IV, Condition B.
Subject mated connectors to 10
humidity/temperature cycles between 25
and 65°C at 95% RH with cold shock at -
1
0
°
C
l
es
s
S
t
e
p
7b
.
Mixed flowing gas. Show no evidence of dam age; meet
termination resistance, dry circuit; and
termination resistance, specified current.
EIA 364-65B, Class llA
Subject mated contacts to environmental
class llA for 10 days.
Temperature life. Shall show no evidence of dam age; meet
termination resistance, dry circuit;
termination resistance, specified current; and
engaging and separating force.
EIA 364-17C
Subject mated connectors to
temperature life for 240 hours at 150°C
for precious metal plated contacts and
90°C for tin plated contacts.
3.4. Connector Tests and Sequences
Test or Examination
T
e
s
t
G
r
ou
p
(
a
)
1 2 3(e)
T
es
t
S
e
q
uenc
e
(
b
)
Exa
m
i
n
a
t
i
o
n
o
f
p
r
oduc
t
1
,
1
0
1
1,
8
Termination resistance, specified current
2,4
Termination resistance, dry circuit 2,7
2,5
,7
Current cycling
3
Contact engaging force 8
Contact separating force 9
Crimp tensile
5
Durability 3
Thermal shock 4
6
Humidity/temperature cycling 6(d)
3
Mixed flowing gas 6(c)
T
e
m
pe
r
a
t
u
r
e
l
i
f
e
5
4
NOTE
(a) Contacts shall be prepared in accordance with applicable Instruction Sheets. They
shall be selected at random from current production. All test groups shall consist of 10
samples of each part number (pin and socket). One-half of the samples shall be
crimped to maxim um gauge wire and the other half crimped to minimum gauge wire. All
wire lengths shall be a minimum of 12 inches.
• Precious metal plated contacts shall be crimped to wire conforming to MIL-W -
16878/4, Type E.
• Tin plated contacts shall be crimped to wire conforming to MIL-W -16878/1, Type B.
(b) Numbers indicate sequence in which tests are performed.
(c) Precious metal plated samples only.
(d) Tin plated samples only.
(e) Test group 3 was tested with 1mm
2
and 0.75mm
2
size wire only
Figure 2