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Product

Specification

108-40018

11Mar11 Rev F

AMP-LATCH* and IDC Header Connectors, .100 X .100 Inch Grid

1. SCOPE

1.1. Content

This specification covers perform ance, tests and quality requirements for AMP-LATCH* universal and

low profile, and IDC standard and low profile .100 X .100 inch grid headers, right angle and vertical

assem blies.

1.2. Qualification

W hen tests are perform ed on subject product line, procedures specified in Figure 1 shall be used. All

inspections shall be perform ed using applicable inspection plan and product drawing.

1.3. Successful qualification testing on the subject product line was com pleted on 03Nov95, additional

testing was com pleted on 23Feb10. The Qualification Test Report num ber for this testing is 501-325.

This documentation is on file at and available from Engineering Practices and Standards (EPS).

2. APPLICABLE DOCUM ENTS

The following documents form a part of this specification to the extent specified herein. Unless

otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the

requirem ents of this specification and the product drawing, the product drawing shall take precedence.

In the event of conflict between the requirements of this specification and referenced docum ents, this

specification shall take precedence.

2.1. TE Connectivity (TE) Docum ents

! 109-1: Test Specification (General Requirem ents for Test Specifications)

! 109 Series: Test Specifications as indicated in Figure 1

! 501-325: Qualification Test Report (Connector, AMPLATCH* Header, .100 X .100 Inch Grid)

2.2. Industry Docum ent

EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications

2.3. Reference Docum ent

109-197: Test Specification (Tyco Electronics Test Specifications vs EIA and IEC Test Methods)

3. REQUIREM ENTS

3.1. Design and Construction

Product shall be of design, construction and physical dim ensions specified on applicable product

drawing.

3.2. Materials

Materials used in the construction of this product shall be as specified on the applicable product

drawing.

a TE Connectivity Ltd. Company

| Indicates change

*Trademark

For latest revision, visit our website at www.te.com/documents.

For Regional Customer Service, visit our website at www.te.com

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TE logo is a trademark. Other products, logos, and company names might be trademarks of their respective owners. LOC B

Summary of content (5 pages)

PAGE 1
Product Specification 108-40018 11Mar11 Rev F AMP-LATCH* and IDC Header Connectors, .100 X .100 Inch Grid 1. SCOPE 1.1. Content This specification covers perform ance, tests and quality requirem ents for AMP-LATCH* universal and low profile, and IDC standard and low profile .100 X .100 inch grid headers, right angle and vertical assem blies. 1.2. Qualification W hen tests are perform ed on subject product line, procedures specified in Figure 1 shall be used.
PAGE 2
108-40018 3.3. Ratings ! ! ! 3.4. Voltage: 250 volts AC Current: Signal application only, 1 am pere m axim um per contact Tem perature: -65 to 105°C Perform ance and Test Description Product is designed to m eet electrical, m echanical and environm ental perform ance requirem ents specified in Figure 1. Unless otherwise specified, all tests shall be perform ed at am bient environm ental conditions per Test Specification 109-1. 3.5.
PAGE 3
108-40018 Test Description Requirem ent Procedure ENVIRONMENTAL Therm al shock. See Note. EIA-364-32, Test Condition II. Subject unm ated specim ens to 5 cycles between -65 and 105°C with 30 m inute dwells at tem perature extrem es. Hum idity/tem perature cycling. See Note. EIA-364-31, Method III. Subject unm ated specim ens to 10 cycles (10 days) between 25 and 65°C at 80 to 100% RH with cold shock.
PAGE 4
108-40018 4. QUALITY ASSURANCE PROVISIONS 4.1. Qualification Testing A. Specim en Selection Specim ens shall be prepared in accordance with applicable Instruction Sheets and shall be selected at random from current production. All test groups shall each consist of a m inim um of 5 headers of each type. B. Test Sequence Qualification inspection shall be verified by testing specim ens as specified in Figure 2. 4.2.
PAGE 5
108-40018 AMP-LATCH Low Profile Header AMP-LATCH Universal Header IDC Standard Profile Header IDC Low Profile Header Figure 3 Contact Retention Rev F 5 of 5