Datasheet

ManualsBrandsTE CONNECTIVITY ManualsPCB ConnectorsPin strip Contact spacing: 2.54 mm Total number of pins: 26 1 pc(s)

Qualification Test

Report

501-325

01Mar10 Rev A

All Paragraphs Revised

AMP-LATCH* and IDC Header Connectors, .100 X .100 Inch

Grid

Harrisburg, PA

All International Rights Reserved

* Trademark

| Indicates change

1 of 4

LOC B

1. INTRODUCTION

1.1. Purpose

Testing was performed on AMP-LATCH* and IDC Header Connectors to determine their conformance

to the requirements of Product Specification 108-40018, Revision E.

1.2. Scope

This report covers the electrical, mechanical, and environmental performance of AMP-LATCH* and IDC

Header Connectors. Testing was performed at the Harrisburg Electrical Components Test Laboratory

between 14Sep95 and 03Nov95, additional testing was performed on low profile headers between

28Jan10 and 23Feb10. The test file numbers for this testing are CTL5227-074-019 and EA20100084T

respectively. This documentation is on file at and available from the Harrisburg Electrical Components

Test Laboratory.

1.3. Conclusion

Specimens listed in paragraph 1.4. conformed to the electrical, mechanical, and environmental

performance requirements of Product Specification 108-40018, Revision E.

1.4. Test Specimens

Test specimens were representative of normal production lots. A Certificate of Conformance (C of C)

was issued stating that all specimens in the test package were produced, inspected, and accepted as

conforming to product drawing requirements, and were manufactured using the same core

manufacturing processes and technologies as production parts. Specimens identified with the following

part numbers were used for test:

Test Group Quantity Part Number Description

1,3

5 each 1-103308-0 Low profile header assembly

5 each 1-102153-0 Universal header assembly

2,3

5 each 1-103310-0 Low profile header assembly

5 each 1-102159-0 Universal header assembly

5 104338-9 Low profile, high temperature header assembly

5 1-111008-0 Universal header for vapor-phase applications

1,3 5 each 5103308-1 Low profile, vertical header assembly

Figure 1

1.5. Environmental Conditions

Unless otherwise stated, the following environmental conditions prevailed during testing:

! Temperature: 15 to 35°C

! Relative Humidity: 25 to 75%

Summary of content (4 pages)

PAGE 1
501-325 Qualification Test Report 01Mar10 Rev A All Paragraphs Revised AMP-LATCH* and IDC Header Connectors, .100 X .100 Inch Grid 1. INTRODUCTION 1.1. Purpose Testing was performed on AMP-LATCH* and IDC Header Connectors to determine their conformance to the requirements of Product Specification 108-40018, Revision E. 1.2. Scope This report covers the electrical, mechanical, and environmental performance of AMP-LATCH* and IDC Header Connectors.
PAGE 2
501-325 1.6. Test Sequence Test Group (a) Test or Examination 1 2 3 Test Sequence (b) Examination of product 1,3,5 1,3 1,8 Insulation resistance 2,6 Withstanding voltage 3,7 Solderability 2 Component resistance to wave soldering 2 Contact retention 4 Thermal shock 4 Humidity/temperature cycling 5 NOTE (a) (b) See paragraph 1.4. Numbers indicate sequence in which tests are performed. Figure 2 2. SUMMARY OF TESTING 2.1.
PAGE 3
501-325 2.7. Thermal Shock No evidence of physical damage was visible as a result of thermal shock testing. 2.8. Humidity/temperature Cycling No evidence of physical damage was visible as a result of humidity/temperature cycling. 3. TEST METHODS 3.1. Examination of Product Specimens were visually examined for evidence of physical damage detrimental to product performance. 3.2. Insulation Resistance Insulation resistance was measured between adjacent contacts of unmated specimens.
PAGE 4
501-325 3.6. Contact Retention An axial load of 2 pounds was applied to each individual contact and held for 6 seconds (see Figure 3). Figure 3 3.7. Thermal Shock Unmated specimens were subjected to 5 cycles between -65 and 105°C with 30 minute dwells at each temperature extreme. Transition between extremes was less than 1 minute. 3.8. Humidity/temperature Cycling Unmated specimens were exposed to 10 humidity/temperature cycles.