User's Manual
Table Of Contents
- Title page
- Table of Contents
- General Safety Summary
- Preface
- Getting Started
- Operating Basics
- Reference
- Reference
- Menu Structures
- The Setup Menu Screen
- The Graphical Waveform Editor
- The Pattern Editor
- Quick Editing
- The Table Editor
- The Equation Editor
- The Sequence Editor
- The APPL Menu
- The UTILITY Window
- External Keyboards
- Setting General Purpose Knob Direction
- Formatting a Floppy Disk
- Displaying Disk Usage
- Screen Display Enable/Disable
- Focused Color
- Displaying Instrument Status
- Internal Clock (Date and Time)
- Resetting the Instrument
- Connecting to a GPIB Network
- Ethernet Networking
- Hardcopy
- Calibration and Diagnostics
- Upgrading the System Software
- Capturing Waveforms
- Waveform Programming Language
- Command Descriptions
- Programming Examples
- File Conversion
- File Management
- FG Mode
- Waveform Mixing Mode
- Synchronous Operation Mode (AWG710B only)
- Appendices
- Appendix A: Specifications (AWG710B)
- Appendix A: Specifications (AWG710)
- Appendix B: Performance Verification (AWG710B)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- External Clock Input and VCO Out Output Tests
- VCO OUT Output Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Synchronous Operation Tests
- Appendix B: Performance Verification (AWG710)
- Conventions
- Self Tests
- Performance Tests
- Operating Mode Tests
- Amplitude and Offset Accuracy Tests (Normal Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (Direct DA Out), (except option 02)
- Amplitude, Offset Accuracy and Rise Time Tests (for option 02)
- Pulse Response Tests (Normal Out), (except option 02)
- Trigger Input Tests
- Event Input and Enhanced Mode Tests
- 1/4 Clock Frequency and 10 MHz Reference Input Tests
- Marker Output Tests
- Appendix C: Inspection and Cleaning
- Appendix D: Sample Waveforms
- Appendix E: File Transfer Interface Outline
- Appendix F: Miscellaneous
- Appendix G: Sequence File Text Format
- Index
AWG710&AWG710B Arbitrary Waveform Generator User Manual 1-1
Getting Started
This section provides the following information:
Description and features of the AWG710&AWG710B Arbitrary Waveform
Generator
Initial inspection procedure
Standard and optional accessories listings
Installation procedures
Power on and off procedures
Repackaging procedure for shipment
Product Description
The AWG710&AWG710B Arbitrary Waveform Generator is a waveform
generator that can generate simple and arbitrary waveforms and generates
one–channel differential output arbitrary waveforms and function generator
waveforms.
The AWG710&AWG710B Arbitrary Waveform Generator allows you to create
sine, triangle, square, ramp, and complex waves, as well as direct current and
noises signals. It allows you to set waveform attributes, such as frequency,
amplitude, and offset.
This instrument contains a hard disk drive, a 3.5–inch floppy disk drive, and
Ethernet interface for storing and recalling waveform data and instrument settings.
You can remotely control the instrument by sending commands through both the
GPIB and 100/10BASE–T interfaces, as well as transfer waveform data directly
from a digital storage oscilloscope to the AWG710&AWG710B Arbitrary
Waveform Generator using the GPIB interface. This enables you to use the
instrument in combination with other measurement equipment and a computer.
Main Features
The AWG710&AWG710B Arbitrary Waveform Generator contains the following
main features:
4.2 GS/s Sampling Rate: AWG710B
4.0 GS/s Sampling Rate: AWG710
8–bit DA converter