User Manual
Table Of Contents
- toc
- Important safety information
- Compliance information
- Preface
- Installation
- Before Installation
- Operating Considerations
- Connecting Probes
- Securing the Oscilloscope
- Powering on the Oscilloscope
- Powering off the Oscilloscope
- Functional Check
- Compensating a TPP0250, TPP0500B or TPP1000 Passive Voltage Prob
- Compensating a non-TPP0250, non-TPP0500B or non-TPP1000 Passive
- Application Module Free Trial
- Installing an Application Module
- Upgrading Bandwidth
- Changing the Language of the User Interface or Keyboard
- Changing the Date and Time
- Signal Path Compensation
- Upgrading Firmware
- Connecting Your Oscilloscope to a Computer
- Connecting a USB Keyboard to Your Oscilloscope
- Get Acquainted with the Instrument
- Acquire the Signal
- Setting Up Analog Channels
- Using the Default Setup
- Using Autoset
- Acquisition Concepts
- Using FastAcq
- How the Analog Acquisition Modes Work
- Changing the Acquisition Mode, Record Length, and Delay Time
- Using Roll Mode
- Act on Event
- Setting Up a Serial or Parallel Bus
- Setting Up Digital Channels
- When and Why to Turn On MagniVu
- Using MagniVu
- Setting Up the RF Inputs
- Trigger Setup
- Display Waveform or Trace Data
- Adding and Removing a Waveform
- Setting the Display Style and Persistence
- Setting Waveform Intensity
- Scaling and Positioning a Waveform
- Setting Input Parameters
- Positioning and Labeling Bus Signals
- Positioning, Scaling, and Grouping Digital Channels
- Viewing Digital Channels
- Annotating the Screen
- Viewing the Trigger Frequency
- Displaying the Frequency Domain Menu
- Analyze Waveform or Trace Data
- Using Markers in the Frequency Domain
- Taking Automatic Measurements in the Time Domain
- Selecting Automatic Measurements in the Time Domain
- Customizing an Automatic Measurement in the Time Domain
- Taking Automatic Measurements in the Frequency Domain
- Taking Digital Voltmeter Measurements
- Taking Manual Measurements with Cursors
- Setting Up a Histogram
- Using Math Waveforms
- Using FFT
- Using Advanced Math
- Using Spectrum Math
- Using Reference Waveforms and Traces
- Using Wave Inspector to Manage Long Record Length Waveforms
- Auto-magnify
- Limit and Mask Testing
- Making Video Tests
- Making Automated Power Measurements
- Save and Recall Information
- Use the Arbitrary Function Generator
- Use the Application Modules
- Appendix A: Warranted Specifications
- Appendix B: TPP0250, TPP0500B and TPP1000: 250€MHz, 500€MHz and
- Appendix C: P6316 General-Purpose Logic Probe Information
- Appendix D: OpenSSL License
Compliance info
rmation
Compliance in
formation
This section lists the EMC (electromagnetic compliance), s afety, and environmental standards with which the instrument
complies.
EMC compliance
EU EMC Direct
ive
Meets intent of Directive 2014/30/EU for Electromagnetic Compatibility. Compliance was demonstrated to the following
specifications as listed in the Official Journal of the European Communities:
EN 61326-1:2006, EN 61326-2-1:2006. EMC requirements for electrical equipment for measurement, control, and
laborator
yuse.
123
CISPR 11:2
003. Radiated and conducted emissions, Group 1, Class A
IEC 61000
-4-2:2001. Electrostatic discharge immunity
IEC 61000
-4-3:2002. RF electromagnetic field immunity
4
IEC 61000
-4-4:2004. Electrical fast transient/burst immunity
IEC 6100
0-4-5:2001. Power line s urge immunity
IEC 6100
0-4-6:2003. Conducted RF immunity
5
IEC 6100
0-4-11:2004. Voltage dips and interruptions immunity
6
EN 61000-3-2:2006. AC power line harmonic emissions
EN 6100
0-3-3:1995.
Voltage changes, fluctuations, and flicker
European contact.
Tektronix UK, Ltd.
Western Peninsula
Western Road
Bracknell, RG12 1RF
United Kingdom
1
This
product is intended for use in nonresidential areas only. Use in residential areas may cause electromagnetic interference.
2
Emissions which exceed the l evels required by this standard may occur when this equipment is connected to a test object.
3
For compliance with the EMC standards listed here, high quality shielded interface cables should be used.
4
Oscilloscope: ≤ 3.0 division waveform displacement and ≤ 6.0 division increase in peak-to-peak noise. RF: Residual spurious
signals in the RF section can typically increase to –50 dBm when the instrument is subjected to electromagnetic interference per the
IEC 61000-4-3 test for frequencies up to 1 GHz, and to –35 dBm for frequencies above 1 GHz.
5
Oscilloscope: ≤ 1.0 division waveform displacement and ≤ 2.0 division increase in peak-to-peak noise. RF: Residual spurious
signals in the RF section can typically increase to –85 dBm when the instrument is subjected to electromagnetic interference
per
the IEC 61000-4-6 test.
6
Performance Criterion C applied at the 70%/25 cycle Voltage-Dip and the 0%/250 cycle Voltage-Interruption test levels (IEC
610
00-4-11).
x MDO3000 Series Oscilloscopes User Manual