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V-Tolerance

H-Tolerance

Introduction

Limit testing is a simple tool that enables engineers and

technicians to quickly identify signal anomalies and act

upon them. Limit testing indicates that a test measurement

occurred outside the limits of a predeﬁned template. It

also shows when the infraction occurred and can trigger

speciﬁc predeﬁned actions. This feature is particularly useful

in automated production and debugging environments.

This application note reviews how you can use the limit test

feature to support your product evaluation and production

testing. It discusses the key differences between standard

single-waveform “+/-“ band templates and the enhanced

dual waveform area-based templates supported by

TBS1000B Series digital storage oscilloscopes.

Using Area-based Templates for

Pass/Fail Waveform Testing

Enhanced Limit Testing with Tektronix TBS1000B Series Oscilloscopes

Application Note

Summary of content (8 pages)

PAGE 1
H-Tolerance V-Tolerance Using Area-based Templates for Pass/Fail Waveform Testing Enhanced Limit Testing with Tektronix TBS1000B Series Oscilloscopes Application Note Introduction Limit testing is a simple tool that enables engineers and technicians to quickly identify signal anomalies and act upon them. Limit testing indicates that a test measurement occurred outside the limits of a predefined template. It also shows when the infraction occurred and can trigger specific predefined actions.
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Application Note H VV V H H H H H V V V Vertical Vertical ToleranceTolerance H H Horizontal Horizontal Vertical ToleranceTolerance Tolerance Vertical Tolerance V V Vertical Tolerance Horizontal Tolerance Horizontal Tolerance V V H H Horizontal Tolerance V V V H H V H H V Vertical Tolerance H Horizontal Tolerance Figures 1a. and 1b. Conventional limit testing.
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Using Area-based Templates for Pass / Fail Limit Waveform Testing Solving Problems Quickly Let’s say you are working with a Keithley Series 2280S-32-6 Programmable DC Power Supply. This instrument has a programmable voltage slew rate when in constant voltage mode. Imagine that your goal is to build an automatic test to ensure that the product’s output fall times are within an acceptable range for a number of slew rate settings. Figure 3. Area-based template to evaluate the rise time of a signal.
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Application Note Figure 4. Trigger set-up. Figure 5. 50ms falling edge becomes the first boundary. Using the TBS1000B’s enhanced limit testing allows you to take advantage of its dual reference waveform template option. 2. On the oscilloscope, push Default Setup and Autoset to trigger a stable waveform on the display. Push Trigger Menu. Choose the following settings: “Edge” as the trigger type, “CH1” as the trigger source, “Falling” for slope, and “Normal” for mode.
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Using Area-based Templates for Pass / Fail Limit Waveform Testing Figure 6. 10ms falling edge becomes the second boundary. Figure 7. Apply the template. 4. 7. On the oscilloscope, press Function, and select “Limit Test”. In the bezel menu, select “CH1” as the source. In the “Template Setup” sub-menu, press Dual Ref and select “Save Second Source” to set the 10ms falling edge as the second boundary. 8. Now you can add vertical and horizontal tolerance to the area defined by the two boundary lines.
PAGE 6
Application Note Conclusion Limit testing is widely used in production environments to verify and validate products. Engineers use it to save valuable time by creating automated tests which can analyze, verify, characterize and validate a product’s operation. Standard limit testing uses only a single waveform to create a test template with specific horizontal and vertical tolerances – a method that is inadequate for applications that have more complex conditions, such as those that change over time.
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Using Area-based Templates for Pass / Fail Limit Waveform Testing www.tektronix.
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