Data Sheet

5
All the new emerging technologies and applications are
requiring verifying the operating margin of your device
emulating worst-case and infrequent corner-case
conditions.
Your device needs to be tested to its performance limit
and stress test” during the product development is vital
to avoid the risk of any device malfunction your customer
ends up nding.
The High Denition T3AWG3252 generator is an ideal for
precisely generating degraded or stressed signals thanks
to the capability to emulate accurately any waveform
details because of the 16-bit vertical resolution and in
addition to emulate large voltage swings because of the
12 V
pp
combined with the ± 6 V HW Voltage baseline.
High Denition T3AWG3252 has unmatched output
voltage window ±24 V, 48 V in case of 50 Ω into High
Impedance or ±12 V , 24 V in case of 50 Ω into 50 Ω.
Denitively you want your device properly working when
inthe presence of signals or noise interfering.
Today’s technology density, co-existing of many
communications systems, highest standard in product
reliability make a must to go for noise and interference
immunity” testing.
The High Denition T3AWG3252 generator is a perfect
arbitrary generator for product noise susceptibility,
interference immunity and EMI applications because of
the excellent output signal spectral purity, the unmatched
deep waveform memory enabling long play-time testing
combined with versatile waveforms creation thanks to the
intuitive and easy waveform sequencer user interface.