User manual

ZD Series Differential Probes
ZDSERIES-GSM-REVA
16
Connecting the Probe to the Test Circuit
To maintain the high performance capability of the probe in measurement applications, care
must be exercised in connecting the probe to the test circuit. Increasing the parasitic
capacitance or inductance in the input paths may introduce a “ring” or slow the rise time of
fast signals. Input leads which form a large loop area will pick up any radiated electromagnetic
field which passes through the loop and may induce noise into the probe input.
Using one of the available accessories makes the ZD Series probe with its small profile and low
mass head ideally suited for applications in dense circuitry.