Datasheet

12-Bit 3µs Sampling
ANALOG-TO-DIGITAL CONVERTER
FEATURES
333k SAMPLES PER SECOND
STANDARD ±10V AND ±5V INPUT RANGES
DC PERFORMANCE OVER TEMP:
No Missing Codes
1/2LSB Integral Linearity Error
3/4LSB Differential Linearity Error
AC PERFORMANCE OVER TEMP:
72dB Signal-to-Noise Ratio
80dB Spurious-Free Dynamic Range
–80dB Total Harmonic Distortion
INTERNAL SAMPLE/HOLD, REFERENCE,
CLOCK, AND THREE-STATE OUTPUTS
POWER DISSIPATION: 215mW max
PACKAGE: 24-Pin Single-Wide DIP
24-Lead SOIC
Comparator
Control
Logic
Internal
Ref
2V
Reference
Out
±5V
IN
±10V
IN
CDAC
SAR
BUSY
Three
State
Parallel
Output
Data
Bus
Clock
Output
Latches
And
Three
State
Drivers
DESCRIPTION
The ADS7800 is a complete 12-bit sampling analog-to-
digital (A/D) converter using state-of-the-art CMOS
structures. It contains a complete 12-bit successive
approximation A/D converter with internal sample/hold,
reference, clock, digital interface for microprocessor
control, and three-state output drivers.
The ADS7800 is specified at a 333kHz sampling rate.
Conversion time is factory set for 2.70µs max over
temperature, and the high-speed sampling input stage
insures a total acquisition and conversion time of 3µs
max over temperature. Precision, laser-trimmed scaling
resistors provide industry-standard input ranges of ±5V
or ±10V.
AC and DC performance are completely specified. Two
grades based on linearity and dynamic performance are
available to provide the optimum price/performance fit in
a wide range of applications.
The 24-pin ADS7800 is available in plastic and side-
braze hermetic 0.3" wide DIPs, and in an SOIC package.
It operates from a +5V supply and either a –12V or –15V
supply. The ADS7800 is available in grades specified
over 0°C to +70°C and –40°C to +85°C temperature
ranges.
ADS7800
SBAS001A – OCTOBER 1989 – REVISED FEBRUARY 2004
www.ti.com
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1989-2004, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.

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