Datasheet

AM3517, AM3505
SPRS550E –OCTOBER 2009–REVISED MARCH 2013 www.ti.com
Table 6-156. JTAG Timing Requirements Free Running Clock Mode
(1)(2)(3)
1.8V 3.3V
NO. PARAMETER UNIT
MIN MAX MIN MAX
JT4 t
c(tck)
Cycle time 20 20 ns
JT5 t
w(tckL)
Typical pulse duration, jtag_tck low 10 10 ns
JT6 t
w(tckH)
Typical pulse duration, jtag_tck high 10 10 ns
t
dc(tck)
Duty cycle error, jtag_tck -1250 1250 -1250 1250 ps
t
j(tck)
Cycle jitter -1250 1250 -1250 1250 ps
JT7 t
su(tdiV-rtckH)
Setup time, jtag_tdi valid before jtag_rtck high 1.8 3.8 ns
JT8 t
h(tdiV-rtckH)
Hold time, jtag_tdi valid after jtag_rtck high 0.7 2.7 ns
JT9 t
su(tmsV-rtckH)
Setup time, jtag_tms valid before jtag_rtck high 1.8 3.8 ns
JT10 t
h(tmsV-rtckH)
Hold time, jtag_tms valid after jtag_rtck high 0.7 2.7 ns
JT12 t
su(emuxV-rtckH)
Setup time, jtag_emux 14.6 14.6 ns
JT13 t
h(emuxV-rtckH)
Hold time,jtag_emux 2 2 ns
(1) Maximum cycle jitter supported by jtag _tck input clock.
(2) x = 0 to 1
(3) The timing requirements are assured for the cycle jitter and duty cycle error conditions specified.
Table 6-157. JTAG Switching Characteristics Free Running Clock Mode
(1)(2)
1.8 V 3.3 V
NO. PARAMETER MIN MAX MIN MAX UNIT
JT1 t
c(rtck)
Cycle time
(1)
, jtag_rtck period 20 20 ns
JT2 t
w(rtckL)
Typical pulse duration, jtag_rtck low 10 10 ns
JT3 t
w(rtckH)
Typical pulse duration, jtag_rtck high 10 10 ns
t
dc(rtck)
Duty cycle error, jtag_rtck -1250 1250 -1250 1250 ps
t
j(rtck)
Jitter standard deviation
(2)
, jtag_rtck 33.33 33.33 ps
t
R(rtck)
Rise time, jtag_rtck 4 4 ns
t
F(rtck)
Fall time, jtag_rtck 4 4 ns
JT11 t
d(rtckL-tdoV)
Delay time, jtag_rtck low to jtag_tdo valid -5.8 5.8 -8 8 ns
t
R(tdo)
Rise time, jtag_tdo 4 4 ns
t
F(tdo)
Fall time, jtag_tdo 4 4 ns
JT14 t
d(rtckH-emuxV)
Delay time, jtag_rtck high to ,jtag_emux 2.7 15.1 2.7 15.1 ns
t
R(emux)
Rise time, jtag_emux 6 6 ns
t
F(emux)
Fall time, jtag_emux 6 6 ns
(1) Related with the jtag_rtck maximum frequency.
(2) The jitter probability density can be approximated by a Gaussian function.
212 Timing Requirements and Switching Characteristics Copyright © 2009–2013, Texas Instruments Incorporated
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