Datasheet
bq500211A
SLUSBB1A – DECEMBER 2012–REVISED SEPTEMBER 2013
www.ti.com
ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SUPPLY CURRENT
I
V33A
V33A = 3.3 V 8 15
I
V33D
Supply current V33D = 3.3 V 44 55 mA
I
TOTAL
V33D = V33A = 3.3 V 52 60
INTERNAL REGULATOR CONTROLLER INPUTS/OUTPUTS
V33 3.3-V linear regulator Emitter of NPN transistor 3.25 3.3 3.6
V
V33FB 3.3-V linear regulator feedback 4 4.6
I
V33FB
Series pass base drive V
IN
= 12 V; current into V33FB pin 10 mA
Beta Series NPN pass device 40
EXTERNALLY SUPPLIED 3.3 V POWER
V33D Digital 3.3-V power T
A
= 25°C 3 3.6
V
V33A Analog 3.3-V power T
A
= 25°C 3 3.6
V33 slew rate between 2.3 V and 2.9 V,
V33Slew V33 slew rate 0.25 V/ms
V33A = V33D
DIGITAL DEMODULATION INPUTS COMM_A+, COMM_A-, COMM_B+, COMM_B-
V
CM
Common mode voltage each pin –0.15 1.631 V
COMM+,
Modulation voltage digital resolution 1 mV
COMM-
R
EA
Input impedance Ground reference 0.5 1.5 3 MΩ
I
OFFSET
Input offset current 1-kΩ source impedance –5 5 µA
ANALOG INPUTS V_SENSE, I_SENSE, T_SENSE, LED_MODE
V
ADDR_OPEN
Voltage indicating open pin LED_MODE open 2.37
V
ADDR_SHORT
Voltage indicating pin shorted to GND LED_MODE shorted to ground 0.36 V
V
ADC_RANGE
Measurement range for voltage monitoring ALL ANALOG INPUTS 0 2.5
INL ADC integral nonlinearity -2.5 2.5 mV
I
lkg
Input leakage current 3 V applied to pin 100 nA
R
IN
Input impedance Ground reference 8 MΩ
C
IN
Input capacitance 10 pF
DIGITAL INPUTS/OUTPUTS
DGND1
V
OL
Low-level output voltage I
OL
= 6 mA , V33D = 3 V
+ 0.25
V33D
V
OH
High-level output voltage I
OH
= -6 mA , V33D = 3 V
V
- 0.6V
V
IH
High-level input voltage V33D = 3V 2.1 3.6
V
IL
Low-level input voltage V33D = 3.5 V 1.4
I
OH
(MAX) Output high source current 4
mA
I
OL
(MAX) Output low sink current 4
SYSTEM PERFORMANCE
V
RESET
Voltage where device comes out of reset V33D Pin 2.3 2.4 V
t
RESET
Pulse width needed for reset RESET pin 2 µs
f
SW
Switching Frequency 112 205 kHz
Time to detect presence of device requesting
t
detect
0.5 s
power
t
retention
Retention of configuration parameters T
J
= 25°C 100 Years
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