Datasheet

DIT4192
2
SBOS229B
www.ti.com
Power-Supply Voltage, V
DD
.............................................................. +6.5V
V
IO
............................................................... +6.5V
Input Current ................................................................................... ±10mA
Digital Input Voltage .......................................................... –0.2V to +5.5V
Digital Output Voltage ............................................ –0.2V to (V
DD
+ 0.2V)
Power Dissipation .......................................................................... 300mW
Operating Temperature Range ...................................... –40°C to + 85°C
Storage Temperature ..................................................... –55°C to +125°C
Lead Temperature (soldering, 5s) ................................................. +260°C
Package Temperature (IR re-flow, 10s)........................................ +235°C
ABSOLUTE MAXIMUM RATINGS
(1)
PACKAGE/ORDERING INFORMATION
SPECIFIED
PACKAGE TEMPERATURE PACKAGE ORDERING TRANSPORT
PRODUCT PACKAGE-LEAD DESIGNATOR
(1)
RANGE MARKING NUMBER MEDIA, QUANTITY
DIT4192 TSSOP-28 PW –40°C to +85°C DIT4192IPW DIT4192IPW Rails, 50
"" " " "DIT4192IPWR Tape and Reel, 2000
NOTE: (1) For the most current specifications and package information, refer to our web site at www.ti.com.
NOTE: (1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional operation of the
device at these or any other conditions beyond those specified is not implied.
ELECTROSTATIC
DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Texas Instru-
ments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degrada-
tion to complete device failure. Precision integrated circuits
may be more susceptible to damage because very small
parametric changes could cause the device not to meet its
published specifications.