Datasheet

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FEATURES
1
2
3
4
8
7
6
5
EMIT OUT
IN+
IN−
V
CC−
V
CC+
COL OUT
BAL/STRB
BALANCE
D PACKAGE
(TOP VIEW)
DESCRIPTION/ORDERING INFORMATION
LM211-EP
DIFFERENTIAL COMPARATOR WITH STROBES
SLCS140A DECEMBER 2002 REVISED MAY 2006
Controlled Baseline Maximum Input Bias Current . . . 300 nA
One Assembly/Test Site, One Fabrication Maximum Input Offset Current . . . 70 nA
Site
Can Operate From Single 5-V Supply
Extended Temperature Performance of
–55 ° C to 125 ° C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Enhanced Product Change Notification
Qualification Pedigree
(1)
Fast Response Times
Strobe Capability
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold-compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range
of power-supply voltages, including ± 15-V supplies for operational amplifiers and 5-V supplies for logic systems.
The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps
or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system
ground. The outputs can drive loads referenced to ground, V
CC+
or V
CC–
. Offset balancing and strobe capabilities
are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state,
regardless of the differential input.
ORDERING INFORMATION
V
IO
max
T
A
PACKAGE
(1)
ORDERABLE PART NUMBER TOP-SIDE MARKING
AT 25 ° C
–40 ° C to 125 ° C 3 mV SOIC D Tape and reel LM211QDREP LM211E
–55 ° C to 125 ° C 3 mV SOIC D Tape and reel LM211MDREP LM211M
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2002–2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

Summary of content (23 pages)