Datasheet

LM27313
SW
FB
GND
V
IN
SHDN
U1
R3
51k
SHDN
GND
5 V
IN
C1
2.2 PF
R2
13.3k
CF
120 pF
D1
MBR0530
R1/205k
L1/10 PH
C2
4.7 PF
20V
OUT
130 mA
(TYP)
LM27313
SW
FB
GND
V
IN
SHDN
U1
R3
51k
SHDN
GND
5 V
IN
C1
2.2 PF
R2
13.3k
CF
220 pF
D1
MBR0520
R1/117k
L1/10 PH
C2
4.7 PF
12V
OUT
260 mA
(TYP)
LM27313
www.ti.com
SNVS487D DECEMBER 2006REVISED APRIL 2013
LM27313/LM27313-Q1
Check for Samples: LM27313
1
FEATURES
DESCRIPTION
The LM27313 switching regulator is a current-mode
2
LM27313-Q1 is an Automotive Grade Product
boost converter with a fixed operating frequency of
that is AEC-Q100 Grade 1 Qualified (-40°C to
1.6 MHz.
+125°C Operating Junction Temperature)
The use of the SOT-23 package, made possible by
30V DMOS FET Switch
the minimal losses of the 800 mA switch, and small
1.6 MHz Switching Frequency
inductors and capacitors result in extremely high
Low R
DS
(ON) DMOS FET
power density. The 30V internal switch makes these
solutions perfect for boosting to voltages of 5V to
Switch Current up to 800 mA
28V.
Wide Input Voltage Range (2.7V–14V)
This part has a logic-level shutdown pin that can be
Low Shutdown Current (<1 µA)
used to reduce quiescent current and extend battery
5-Lead SOT-23 Package
life.
Uses Tiny Capacitors and Inductors
Protection is provided through cycle-by-cycle current
Cycle-by-Cycle Current Limiting
limiting and thermal shutdown. Internal compensation
Internally Compensated
simplifies design and reduces component count.
APPLICATIONS
White LED Current Source
PDA’s and Palm-Top Computers
Digital Cameras
Portable Phones, Games and Media Players
GPS Devices
Typical Application Circuits
1
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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